Prof. Nathan A. Hagen
Professor at Utsunomiya Univ
SPIE Involvement:
Awards Committee | Conference Program Committee | Author | Instructor | Student Chapter Advisor
Area of Expertise:
optical design , polarimetry , imaging spectrometry , computational sensing , aberration theory , infrared imaging
Websites:
Publications (65)

Proceedings Article | 20 November 2024 Paper
Proceedings Volume 13241, 132410T (2024) https://doi.org/10.1117/12.3038696
KEYWORDS: Polarization, Fisheye lenses, Modulation transfer functions, Image quality, Image resolution, Distortion, Chromatic aberrations

Proceedings Article | 3 October 2024 Presentation + Paper
Proceedings Volume 13144, 131440M (2024) https://doi.org/10.1117/12.3026977
KEYWORDS: Coating, Emissivity, Coating thickness, Aluminum, Metals, Reflectivity, Black bodies, Inhomogeneities, Oxides, Infrared radiation

Proceedings Article | 28 May 2024 Presentation + Paper
Proceedings Volume 13083, 1308305 (2024) https://doi.org/10.1117/12.3022652
KEYWORDS: Tunable filters, Optical filters, Imaging systems, Cameras, Polarization, Multispectral imaging

Proceedings Article | 13 March 2024 Presentation
Proceedings Volume 12909, 129090M (2024) https://doi.org/10.1117/12.3008856
KEYWORDS: Polarization, Cameras, Imaging systems, RGB color model, Wave plates, Industrial applications, Image analysis, Polarization analysis, Microscopes, Interferometry

Proceedings Article | 4 March 2024 Paper
Proceedings Volume 13070, 130701E (2024) https://doi.org/10.1117/12.3021809

Showing 5 of 65 publications
Conference Committee Involvement (9)
Optical Technology and Measurement for Industrial Applications Conference
21 April 2025 | Yokohama, Japan
SPIE Future Sensing Technologies
22 April 2024 | Yokohama, Japan
Optical Technology and Measurement for Industrial Applications Conference
22 April 2024 | Yokohama, Japan
Optical Technology and Measurement for Industrial Applications Conference
17 April 2023 | Yokohama, Japan
Optical Technology and Measurement for Industrial Applications Conference 2022
18 April 2022 | Yokohama, Japan
Showing 5 of 9 Conference Committees
Course Instructor
SC1220: Imaging Spectrometry
This course covers the design and analysis of imaging spectrometers, from instrumentation to evaluation and data exploitation. After surveying the fundamentals of spectral imaging, the course provides a detailed survey of various implementations of imaging spectrometers and the benefits of each approach, with special attention to snapshot systems. Performance tradeoffs of noise, light collection capacity, robustness, and other evaluation metrics are introduced and explained, providing a quantitative means of comparing systems. Finally, the course reviews several commonly used algorithms for spectral imaging data and spectral classification, drawing examples from target tracking, infrared gas cloud imaging, and biological fluorescence imaging.
SC1212: Quantitative Imaging with Uncooled Infrared Cameras
Within the infrared community, it is widely held that uncooled sensors are incapable of doing accurate quantitative work. This course aims to show that quantitative imaging is actually possible with uncooled systems by demonstrating the steps to achieve radiometric calibration in detail and establishing the limits of what can be achieved. Throughout the course, the emphasis is on material that is practical for camera users, rather than for detector designers. The course material provides a thorough introduction into microbolometer pixel design and clarifies the differences between uncooled infrared sensors and photon-integrating sensors. Many of the examples provided are drawn from outdoor measurements, and the course provides a discussion of how to model atmospheric effects on infrared sensing in order to make sense of the thermal infrared world. Examples of quantitative measurements are drawn from the author’s work in infrared gas imaging, atmospheric sensing, and imaging of thermal dynamics.
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