We demonstrate an electro-optic imaging system for measuring millimeter-wave propagation along a coplanar waveguide (CPW). A polarization-resolved microscope images small electro-optic effects due to millimeter-wave voltages between the signal and ground of the CPW. Dual electro-optic frequency combs demonstrate time-domain waveform imaging on-wafer with >100 GHz of bandwidth. A second configuration demonstrates continuous wave optically-derived vector network analysis with measurement planes on-wafer, filling the role of multiple electronic network analyzers but with instantaneous bandwidth and time-domain capability that cannot be achieved otherwise.
We demonstrate ultrawideband mmWave waveform generation based on optical frequency combs and additive frequency synthesis. We generate an electro-optic frequency comb, apply fine amplitude and phase control to pairs of comb lines (beat notes), and demultiplex the beat notes to multiple uni-traveling carrier photodiodes, which are connected on-wafer to a mmWave frequency combiner.
Using multi-tier microwave S-parameter and power calibrations, we demonstrate on-wafer mmWave power levels up to +12.7 dBm and fine amplitude and phase control with 0.1 dB and 25 mrad resolutions respectively. We apply this fine resolution to arbitrary waveform generation with 100 GHz of instantaneous bandwidth on a single photodiode. We also summarize new results with five photodiodes connected to an on-wafer frequency combiner and our efforts to integrate NIST’s high-power amplifiers up to 500 GHz and beyond.
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