Nils Benkert
at Fraunhofer IOF
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 4 November 2003 Paper
Proceedings Volume 5188, (2003) https://doi.org/10.1117/12.505585
KEYWORDS: Scatter measurement, Scattering, Light scattering, Reflectivity, Transmittance, Vacuum ultraviolet, Atomic force microscopy, Thin film coatings, Backscatter, Optical coatings

Proceedings Article | 30 May 2003 Paper
Proceedings Volume 4932, (2003) https://doi.org/10.1117/12.472392
KEYWORDS: Vacuum ultraviolet, Optical components, Laser optics, Dysprosium, Scattering, Laser induced damage, Ruthenium, Scatter measurement, Surface roughness, Reflectivity

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