Dr. Olivier Hignette Profile

Dr. Olivier Hignette

Senior Engineer at ESRF - The European Synchrotron

SPIE Involvement:

Author

Publications (18)

Proceedings Article | 29 August 2006 Paper

Graded multilayers for focusing hard x-rays below 50 nm

Ch. Morawe, O. Hignette, P. Cloetens, W. Ludwig, Ch. Borel, P. Bernard, A. Rommeveaux

Proceedings Volume 6317, 63170F (2006) https://doi.org/10.1117/12.679039

KEYWORDS: Mirrors, Diffraction, Multilayers, Reflection, Reflectivity, X-rays, Refraction, Coating, Synchrotrons, X-ray optics

Read Abstract +

Proceedings Article | 17 September 2005 Paper

Mirror metrology and bender characterization at ESRF

Amparo Rommeveaux, Olivier Hignette, Christian Morawe

Proceedings Volume 5921, 59210N (2005) https://doi.org/10.1117/12.621379

KEYWORDS: Mirrors, Metrology, Head, Interferometers, Platinum, X-rays, Calibration, Interferometry, Optical components, Optical testing

Read Abstract +

Proceedings Article | 17 September 2005 Paper

Results of x-ray mirror round-robin metrology measurements at the APS, ESRF, and SPring-8 optical metrology laboratories

Lahsen Assoufid, Amparo Rommeveaux, Haruhiko Ohashi, Kazuto Yamauchi, Hidekazu Mimura, Jun Qian, Olivier Hignette, Tetsuya Ishikawa, Christian Morawe, Albert Macrander, Ali Khounsary, Shunji Goto

Proceedings Volume 5921, 59210J (2005) https://doi.org/10.1117/12.623209

KEYWORDS: Mirrors, Silicon, Metrology, Data conversion, Error analysis, Sensors, X-rays, Fourier transforms, Optical metrology, Synchrotron radiation

Read Abstract +

Proceedings Article | 23 December 2003 Paper

Influence of crystal surface roughness on the angular spread of x-ray diffracted beam

Jaromira Hrda, Jaromir Hrdy, Olivier Hignette, Joanna Hoszowska

Proceedings Volume 5195, (2003) https://doi.org/10.1117/12.505553

KEYWORDS: Crystals, Surface finishing, Diffraction, Laser crystals, Polishing, X-rays, X-ray diffraction, Silicon, Monochromators, Etching

Read Abstract +

Proceedings Article | 24 December 2002 Paper

The present state of Kirkpatrick-Baez mirror systems at the ESRF

Yves Dabin, Gérard Rostaing, Olivier Hignette, Amparo Rommeveaux, Andreas Freund

Proceedings Volume 4782, (2002) https://doi.org/10.1117/12.455686

KEYWORDS: Mirrors, X-rays, Silicon, Multilayers, Reflectivity, Platinum, Californium, Interfaces, Alignment procedures, Actuators

Read Abstract +

Proceedings Article | 24 December 2002 Paper

Toroidal mirror for single-pulse experiments on ID09B

Laurent Eybert, Michael Wulff, Wolfgang Reichenbach, A. Plech, F. Schotte, E. Gagliardini, Lin Zhang, Olivier Hignette, Amparo Rommeveaux, Andreas Freund

Proceedings Volume 4782, (2002) https://doi.org/10.1117/12.455683

KEYWORDS: Mirrors, Monochromators, X-rays, Diffraction, Photons, Polishing, Platinum, Actuators, Reflectivity, Silicon

Read Abstract +

Proceedings Article | 24 December 2002 Paper

Design and performance of the flexural-hinge-based mirror bender at the SLS protein crystallography beamline X06SA

Daniel Rossetti, Ulrich Lienert, Claude Pradervand, Roman Schneider, Ming Shi, Sasa Zelenika, Michel Rossat, Olivier Hignette, Amparo Rommeveaux, Clemens Schulze-Briese

Proceedings Volume 4782, (2002) https://doi.org/10.1117/12.453695

KEYWORDS: Mirrors, Actuators, Proteins, Laser sintering, Crystallography, Kinematics, Crystals, Silica, Metrology, Surface roughness

Read Abstract +

Proceedings Article | 13 December 2001 Paper

Tunable diffractive optical elements for hard x-rays

Christian David, Bernd Noehammer, Eric Ziegler, Olivier Hignette

Proceedings Volume 4499, (2001) https://doi.org/10.1117/12.450226

KEYWORDS: Diffraction, Lenses, Zone plates, Wet etching, Silicon, Hard x-rays, Etching, Synchrotrons, X-rays, Fabrication

Read Abstract +

Proceedings Article | 13 December 2001 Paper

Submicron focusing of hard x rays with reflecting surfaces at the ESRF

Olivier Hignette, Gerard Rostaing, Peter Cloetens, Amparo Rommeveaux, Wolfgang Ludwig, Andreas Freund

Proceedings Volume 4499, (2001) https://doi.org/10.1117/12.450227

KEYWORDS: Mirrors, X-rays, Metrology, Tolerancing, Cameras, Bismuth, Sensors, Polishing, Diffraction, Microscopy

Read Abstract +

Proceedings Article | 14 November 2001 Paper

Towards the preparation of optical surfaces preserving the coherence of hard x-ray beams

Olivier Hignette, Christophe Peffen, Virginie Alvaro, Elia Chinchio, Andreas Freund

Proceedings Volume 4501, (2001) https://doi.org/10.1117/12.448497

KEYWORDS: Mirrors, Metrology, Wavefronts, X-rays, X-ray optics, Ion beams, Multilayers, Spatial frequencies, Synchrotrons, Surface finishing

Read Abstract +

Proceedings Article | 16 November 1999 Paper

Design and performance of graded multilayers

Christian Morawe, Jean-Christophe Peffen, Olivier Hignette, Eric Ziegler

Proceedings Volume 3773, (1999) https://doi.org/10.1117/12.370083

KEYWORDS: Mirrors, Multilayers, Reflectivity, X-rays, Crystals, Monochromators, Solids, Sputter deposition, Silicon, Ions

Read Abstract +

Proceedings Article | 1 November 1997 Paper

Incoherent x-ray mirror surface metrology

Olivier Hignette, Andreas Freund, Elia Chinchio

Proceedings Volume 3152, (1997) https://doi.org/10.1117/12.295559

KEYWORDS: Mirrors, X-rays, Metrology, CCD cameras, Monochromators, Calibration, Cameras, Crystals, Charge-coupled devices, Time metrology

Read Abstract +

Proceedings Article | 22 November 1996 Paper

R&D program on bimorph mirrors at the ESRF

Jean Susini, Danielle Labergerie, Olivier Hignette

Proceedings Volume 2856, (1996) https://doi.org/10.1117/12.259866

KEYWORDS: Mirrors, Electrodes, Ceramics, Ferroelectric materials, X-rays, Polishing, Silicon, Interferometry, Control systems, Spherical lenses

Read Abstract +

Proceedings Article | 22 November 1996 Paper

X-ray focusing using elliptically bent multilayers

Eric Ziegler, Olivier Hignette, Manohar Lingham, Alexei Souvorov

Proceedings Volume 2856, (1996) https://doi.org/10.1117/12.259850

KEYWORDS: Mirrors, X-rays, Multilayers, Synchrotrons, Silicon, Crystals, Distortion, Cameras, Optical components, Monochromators

Read Abstract +

Proceedings Article | 22 November 1996 Paper

Status of the optical metrology at the ESRF

Olivier Hignette, Amparo Rommeveaux

Proceedings Volume 2856, (1996) https://doi.org/10.1117/12.259863

KEYWORDS: Mirrors, Medium wave, In situ metrology, Metrology, Active optics, X-ray optics, X-rays, Optical metrology, Wavefronts, Sensors

Read Abstract +

Proceedings Article | 19 July 1996 Paper

X-ray interferometry technique for mirror and multilayer characterization

Igor Schelokov, Olivier Hignette, Carsten Raven, Anatoly Snigirev, Irina Snigireva, Alexey Suvorov

Proceedings Volume 2805, (1996) https://doi.org/10.1117/12.245104

KEYWORDS: Mirrors, X-rays, Coherence (optics), Optical components, Particles, Holography, Modulation, Interferometry, Multilayers, Holograms

Read Abstract +

Proceedings Article | 19 July 1996 Paper

Surface characterization of an XMM mandrel at the European Synchrotron Radiation Facility: part II

Samuel Gougeon, Olivier Hignette, Andreas Freund, Ulrich Lienert, Philippe Gondoin, Daniel de Chambure

Proceedings Volume 2805, (1996) https://doi.org/10.1117/12.245082

KEYWORDS: X-rays, Scattering, Laser scattering, Mirrors, Spatial frequencies, Image quality, Crystals, Autoregressive models, Laser induced plasma spectroscopy, Spatial resolution

Read Abstract +

Proceedings Article | 1 June 1990 Paper

Large-bandwidth deep-UV microscopy for CD metrology

Olivier Hignette, Janusz Woch, Laurence Gotti

Proceedings Volume 1261, (1990) https://doi.org/10.1117/12.20036

KEYWORDS: Ultraviolet radiation, Photoresist materials, Visible radiation, Scanning electron microscopy, Deep ultraviolet, Image acquisition, Absorption, Microscopy, Critical dimension metrology, Image processing

Read Abstract +

Showing 5 of 18 publications

Conference Committee Involvement (4)

Advances in Metrology for X-Ray and EUV Optics II

30 August 2007 | San Diego, California, United States

Advances in X-Ray/EUV Optics and Components II

27 August 2007 | San Diego, California, United States

Advances in X-Ray/EUV Optics, Components, and Applications

14 August 2006 | San Diego, California, United States

Advances in Metrology for X-Ray and EUV Optics

2 August 2005 | San Diego, California, United States

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases

Search In:

Publication Years