Mr. Pavel Pavlicek Profile

Pavel Pavlicek

at Palacký Univ Olomouc

SPIE Involvement:

Conference Program Committee | Author

Proceedings Article | 27 October 2021 Paper

Optically smooth and optically rough surfaces in 3D profilometry

Pavel Pavlicek

Proceedings Volume 11927, 119270G (2021) https://doi.org/10.1117/12.2616263

KEYWORDS: Phase measurement, Optical testing, Speckle pattern, Sensors, Numerical simulations, Imaging systems, 3D metrology, Statistical analysis, Interferometry, Solids

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Proceedings Article | 30 December 2019 Paper

Coherence scanning interferometry with two polarization states

Pavel Pavliček, Jonatan Kučera, Nathan Hagen, Yukitoshi Otani

Proceedings Volume 11385, 113850E (2019) https://doi.org/10.1117/12.2542811

KEYWORDS: Polarization, Cameras, Interferometry, Wave plates, Mirrors, Interferometers, Light sources, Light emitting diodes, CCD cameras, Physics

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Proceedings Article | 3 October 2019 Paper

White-light interferometer with tunable lens

Pavel Pavliček, Jonatan Kučera

Proceedings Volume 11207, 112070K (2019) https://doi.org/10.1117/12.2526745

KEYWORDS: Interferometers, Sensors, Interferometry, Imaging systems, 3D metrology, Measurement devices

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Proceedings Article | 18 December 2018 Paper

White-light interferometry without depth scan

Pavel Pavliček, Erik Mikeska

Proceedings Volume 10976, 109760O (2018) https://doi.org/10.1117/12.2517877

KEYWORDS: Interferometers, Fiber optics, 3D metrology, Sensors, Interferometry

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Proceedings Article | 23 December 2016 Paper

Fast white-light interferometry with Hilbert transform evaluation

Pavel Pavliček, Erik Mikeska

Proceedings Volume 10142, 101420Y (2016) https://doi.org/10.1117/12.2261951

KEYWORDS: Interferometry, Interferometers, Light sources, Light emitting diodes, Time metrology, Mirrors, Demodulation, Fourier transforms, Physics, Michelson interferometers

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Proceedings Article | 17 July 2015 Paper

Measurement of the shape of objects by shape from focus

Pavel Pavliček

Proceedings Volume 9524, 952412 (2015) https://doi.org/10.1117/12.2189187

KEYWORDS: Light sources, Imaging systems, Distance measurement, Objectives, CCD cameras, Light emitting diodes, Image quality, Interferometry, Convolution, Beam splitters

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Proceedings Article | 5 December 2014 Paper

White-light interferometry with high measurement speed

Pavel Pavliček, Vojtěch Svak

Proceedings Volume 9441, 944115 (2014) https://doi.org/10.1117/12.2084973

KEYWORDS: Interferometry, Light sources, Time metrology, Fourier transforms, Optical scanning systems, Mirrors, Light emitting diodes, Michelson interferometers, Physics, Skin

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Proceedings Article | 5 December 2014 Paper

Optical methods for the measurement of the shape of objects and their measurement uncertainty

Pavel Pavliček

Proceedings Volume 9441, 94411K (2014) https://doi.org/10.1117/12.2084971

KEYWORDS: Interferometry, CCD cameras, Light sources, Geometrical optics, Optical testing, Sensors, Confocal microscopy, Michelson interferometers, Cameras, Spectral resolution

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Proceedings Article | 22 June 2013 Paper

Measurement of the shape of objects by two wavelength interferometry

Pavel Pavlíček, Dinesh Naik

Proceedings Volume 8769, 87690H (2013) https://doi.org/10.1117/12.2019001

KEYWORDS: Interferometry, Light sources, Interferometers, Michelson interferometers, Laser interferometry, Mirrors, Cameras, Precision optics, 3D metrology, CCD cameras

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Proceedings Article | 18 December 2012 Paper

White-light interferometry, Hilbert transform, and noise

Pavel Pavlíček, Václav Michálek

Proceedings Volume 8697, 86970B (2012) https://doi.org/10.1117/12.2007299

KEYWORDS: Interferometry, Interference (communication), Demodulation, Light sources, Fourier transforms, Phase measurement, Cameras, Interferometers, Mirrors, Imaging systems

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Proceedings Article | 20 November 2008 Paper

Influence of surface roughness on the measurement uncertainty of white-light interferometry

Pavel Pavlíček

Proceedings Volume 7141, 71410R (2008) https://doi.org/10.1117/12.822372

KEYWORDS: Surface roughness, Interferometry, Speckle pattern, Imaging systems, Image resolution, Light sources, Interferometers, Scattering, Sodium, CCD cameras

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Proceedings Article | 12 April 2007 Paper

Spatial coherence profilometry

Pavel Pavlíček, Zhihui Duan, Mitsuo Takeda

Proceedings Volume 6609, 660916 (2007) https://doi.org/10.1117/12.739667

KEYWORDS: Spatial coherence, Light sources, Interferometry, Interferometers, Glasses, Mirrors, Michelson interferometers, Beam splitters, Cameras, Sensors

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Proceedings Article | 7 February 2005 Paper

LCD-based low spatial coherence interferometer

Zhihui Duan, Pavel Pavlicek, Yoko Miyamoto, Mitsuo Takeda

Proceedings Volume 5636, (2005) https://doi.org/10.1117/12.576101

KEYWORDS: Spatial frequencies, Spatial coherence, Light sources, Mirrors, Interferometry, Glasses, 3D image reconstruction, Interferometers, Holography, Temporal coherence

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Proceedings Article | 21 November 2003 Paper

Height profile measurement by means of white light interferometry

Pavel Pavlicek

Proceedings Volume 5259, (2003) https://doi.org/10.1117/12.545112

KEYWORDS: Optical interferometry, Mirrors, Modulation, Speckle, Interferometry, Light sources, Michelson interferometers, Interferometers, CCD cameras, Sensors

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Proceedings Article | 21 November 2003 Paper

Experimental realization of quantum random number generator

Jan Soubusta, Ondrej Haderka, Martin Hendrych, Pavel Pavlicek

Proceedings Volume 5259, (2003) https://doi.org/10.1117/12.545053

KEYWORDS: Sensors, Electronics, Avalanche photodetectors, Fiber couplers, Semiconductor lasers, Attenuators, Pulsed laser operation, Fiber optics, Fiber optic components, Prototyping

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Showing 5 of 15 publications

Conference Committee Involvement (7)

Optical Technology and Measurement for Industrial Applications Conference

21 April 2025 | Yokohama, Japan

Optical Technology and Measurement for Industrial Applications Conference

22 April 2024 | Yokohama, Japan

Optical Technology and Measurement for Industrial Applications Conference

17 April 2023 | Yokohama, Japan

Optical Technology and Measurement for Industrial Applications Conference 2022

18 April 2022 | Yokohama, Japan

Optical Technology and Measurement for Industrial Applications Conference

20 April 2021 | Online, Japan

Showing 5 of 7 Conference Committees

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