Prof. Peizheng Yan Profile

Prof. Peizheng Yan

at Hefei University of technology

SPIE Involvement:

Author

Publications (5)

SPIE Journal Paper | 7 January 2022

Elimination of overexposed area and its phase correction method in speckle pattern interferometry

Yonghong Wang, Shuangle Wu, Yanfeng Yao, Chen Li, Peizheng Yan

OE, Vol. 61, Issue 06, 061402, (January 2022) https://doi.org/10.1117/12.10.1117/1.OE.61.6.061402

KEYWORDS: Interferometry, Glasses, Speckle pattern, Polarization, Polarizers, Optical filters, Cameras, Optical engineering, Phase measurement, Reflection

Read Abstract +

Proceedings Article | 19 November 2021 Paper

Elimination method of overexposed areas in speckle pattern interferometry

Shuangle Wu, Yanfeng Yao, Xiangwei Liu, Huanqing Wang, Yonghong Wang, Peizheng Yan

Proceedings Volume 12059, 120590S (2021) https://doi.org/10.1117/12.2611962

KEYWORDS: Glasses, Polarizers, Speckle pattern, Shearography, Optical filters, Interferometry, Polarization, Reflection, Imaging systems, Phase measurement

Read Abstract +

SPIE Journal Paper | 10 December 2020

Fast automatic multi-defects recognition based on the spatial characteristics of Freeman chain code

Xiao Zhang, Yonghong Wang, Qihan Zhao, Fengqing Bao, Shuangle Wu, Peizheng Yan

OE, Vol. 59, Issue 12, 124103, (December 2020) https://doi.org/10.1117/12.10.1117/1.OE.59.12.124103

KEYWORDS: Detection and tracking algorithms, Shearography, Edge detection, Optical engineering, Defect detection, Speckle, Composites, Binary data, Algorithm development, Nondestructive evaluation

Read Abstract +

SPIE Journal Paper | 31 May 2019

Spatial phase-shift digital shearography for simultaneous measurements in three shearing directions based on adjustable aperture multiplexing

Peizheng Yan, Fangyuan Sun, Xizuo Dan, Qihan Zhao, Yonghong Wang, Yu Lu

OE, Vol. 58, Issue 05, 054105, (May 2019) https://doi.org/10.1117/12.10.1117/1.OE.58.5.054105

KEYWORDS: Shearography, Nondestructive evaluation, Multiplexing, Fourier transforms, Beam splitters, Phase measurement, Speckle pattern, Optical engineering, Sun, Lutetium

Read Abstract +

SPIE Journal Paper | 25 May 2018

High-efficiency and high-accuracy digital speckle correlation for full-field image deformation measurement

Yu Lu, Jiang Han, Yonghong Wang, Xizuo Dan, Siyuan Bao, Peizheng Yan

OE, Vol. 57, Issue 05, 054116, (May 2018) https://doi.org/10.1117/12.10.1117/1.OE.57.5.054116

KEYWORDS: Speckle, Image registration, Digital image correlation, Digital imaging, CCD image sensors, Charge-coupled devices, Computer simulations, Optical engineering, Lutetium, Mechanical efficiency

Read Abstract +

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases

Search In:

Publication Years