Dr. Philippe P. Troussel
Researcher at Commissariat a l'Energie Atomique
SPIE Involvement:
Author
Publications (15)

Proceedings Article | 19 September 2016 Presentation + Paper
T. Caillaud, E. Alozy, M. Briat, P. Cornet, S. Darbon, A. Dizière, A. Duval, V. Drouet, J. Fariaut, D. Gontier, O. Landoas, B. Marchet, I. Masclet-Gobain, G. Oudot, G. Soullié, P. Stemmler, C. Reverdin, R. Rosch, A. Rousseau, B. Rossé, C. Rubbelynck, P. Troussel, B. Villette, F. Aubard, S. Huelvan, R. Maroni, P. Llavador, V. Allouche, M. Burillo, C. Chollet, C. D'Hose, B. Prat, C. Trosseille, J. Raimbourg, C. Zuber, J. P. Lebreton, S. Perez, J. L. Ulmer, T. Jalinaud, J. Jadaud, J. L. Bourgade, R. Wrobel, X. Rogue, J. L. Miquel
Proceedings Volume 9966, 996606 (2016) https://doi.org/10.1117/12.2238017
KEYWORDS: Diagnostics, X-ray imaging, X-rays, Image resolution, Spectrometers, Sensors, Hard x-rays, Optical filters, Imaging systems, Mirrors

Proceedings Article | 26 August 2015 Paper
Ph. Troussel, A. Do, D. Gontier, D. Dennetiere, P. Høghøj, S. Hedacq
Proceedings Volume 9588, 958805 (2015) https://doi.org/10.1117/12.2188185
KEYWORDS: Mirrors, Microscopes, X-ray imaging, Reflectivity, Multilayers, X-rays, Spatial resolution, Zone plates, Gold, X-ray optics

Proceedings Article | 3 May 2013 Paper
B. Emprin, Ph. Troussel, B. Villette, F. Delmotte
Proceedings Volume 8777, 87771B (2013) https://doi.org/10.1117/12.2016832
KEYWORDS: Mirrors, Reflectivity, Chromium, Silica, Multilayers, X-rays, Silicon, Calibration, Optical filters, Sensors

Proceedings Article | 15 October 2012 Paper
D. Dennetiere, P. Audebert, R. Bahr, S. Bole, J. L. Bourgade, B. Brannon, F. Girard, G. Pien, Ph. Troussel
Proceedings Volume 8505, 85050G (2012) https://doi.org/10.1117/12.929490
KEYWORDS: Mirrors, Diagnostics, Reflectivity, X-rays, Image resolution, Imaging systems, Microscopes, Fusion energy, Multilayers, X-ray imaging

Proceedings Article | 28 September 2011 Paper
Ph. Troussel, D. Dennetiere, R. Rosch, C. Reverdin, H. Hartmann, F. Bridou, E. Meltchakov, F. Delmotte
Proceedings Volume 8139, 81390C (2011) https://doi.org/10.1117/12.895944
KEYWORDS: Microscopes, Mirrors, Reflectivity, X-rays, X-ray imaging, Multilayers, Spatial resolution, Grazing incidence, Diagnostics, Imaging systems

Showing 5 of 15 publications
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