Dr. Pierre M. Echternach Profile

Dr. Pierre M. Echternach

at Jet Propulsion Lab

SPIE Involvement:

Author

Publications (19)

SPIE Journal Paper | 6 January 2021 Open Access

Large array of low-frequency readout quantum capacitance detectors

Pierre Echternach, Andrew Beyer, Charles Bradford

JATIS, Vol. 7, Issue 01, 011003, (January 2021) https://doi.org/10.1117/12.10.1117/1.JATIS.7.1.011003

KEYWORDS: Capacitance, Sensors, Quantum chromodynamics, Resonators, Optical filters, Digital filtering, Quasiparticles, Linear filtering, Terahertz radiation, Superconductors

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Proceedings Article | 15 December 2020 Presentation

Ultra-low noise TES bolometer arrays for the US SAFARI contribution

Roger O'Brient, Charles Bradford, Matthew Kenyon, Hien Nguyen, Howard Hui, Pierre Echternach, Gert de Lange, Damian Audley, Jan van der Kuur

Proceedings Volume 11453, 114531L (2020) https://doi.org/10.1117/12.2563116

KEYWORDS: Bolometers, Sensors, Spectroscopy, Silicon, Optical fabrication, Sensor performance

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Proceedings Article | 13 September 2019 Paper

Critical characteristics of coronagraph masks influencing high contrast performance

Kunjithapatham Balasubramanian, Byoung-Joon Seo, Keith Patterson, Camilo Mejia Prada, A.J. Eldorado Riggs, Hanying Zhou, Dwight Moody, Eric Cady, Victor White, Karl Yee, Richard Muller, Pierre Echternach, Frank Greer, Daniel Wilson

Proceedings Volume 11117, 111171H (2019) https://doi.org/10.1117/12.2530825

KEYWORDS: Coronagraphy, Tolerancing, Dispersion

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Proceedings Article | 24 July 2018 Presentation + Paper

A submm-wave comet explorer for water isotopic composition measurements

Imran Mehdi, Paul von Allmen, Jacob Kooi, Mathieu Choukroun, Paul Goldsmith, Darren Hayton, Bruce Bumble, Pierre Echternach, Sabrina Feldman

Proceedings Volume 10698, 106980F (2018) https://doi.org/10.1117/12.2313041

KEYWORDS: Comets, Receivers, Signal to noise ratio, Telescopes, Sensors, Heterodyning, Cryogenics, Solar system, Temperature metrology, Superconductors

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Proceedings Article | 12 September 2017 Presentation + Paper

Fabrication of coronagraph masks and laboratory scale star-shade masks: characteristics, defects, and performance

Kunjithapatham Balasubramanian, A. J. Eldorado Riggs, Eric Cady, Victor White, Karl Yee, Daniel Wilson, Pierre Echternach, Richard Muller, Camilo Mejia Prada, Byoung-Joon Seo, Fang Shi, Daniel Ryan, Santos Fregoso, Jacob Metzman, Robert Casey Wilson

Proceedings Volume 10400, 104000C (2017) https://doi.org/10.1117/12.2274059

KEYWORDS: Photomasks, Exoplanets, Electron beam lithography, Silicon, Stars, Reflectivity, Wavefronts, Performance modeling, Polarimetry

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SPIE Journal Paper | 7 December 2015

WFIRST-AFTA coronagraph shaped pupil masks: design, fabrication, and characterization

Kunjithapatham Balasubramanian, Victor White, Karl Yee, Pierre Echternach, Richard Muller, Matthew Dickie, Eric Cady, Camilo Prada, Daniel Ryan, Ilya Poberezhskiy, Brian Kern, Hanying Zhou, John Krist, Bijan Nemati, A. J. Eldorado Riggs, Neil Zimmerman, N. Jeremy Kasdin

JATIS, Vol. 2, Issue 01, 011005, (December 2015) https://doi.org/10.1117/12.10.1117/1.JATIS.2.1.011005

KEYWORDS: Photomasks, Silicon, Coronagraphy, Reflectivity, Semiconducting wafers, Aluminum, Point spread functions, Wavefronts, Optical instrument design, Etching

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Proceedings Article | 5 October 2015 Presentation

Nanofabrication of ultra-low reflectivity black silicon surfaces and devices (Presentation Recording)

Victor White, Karl Yee, Kunjithapatham Balasubramanian, Pierre Echternach, Richard Muller, Matthew Dickie, Eric Cady, Daniel Ryan, Michael Eastwood, Byron van Gorp, A. J. Eldorado Riggs, Niel Zimmerman, N. Jeremy Kasdin

Proceedings Volume 9556, 955609 (2015) https://doi.org/10.1117/12.2189216

KEYWORDS: Reflectivity, Nanofabrication, Silicon, Optical components, Visible radiation, Coronagraphy, Spectrometers, Aerospace engineering, Nanotechnology, Infrared radiation

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Proceedings Article | 16 September 2015 Paper

Exoplanet coronagraph shaped pupil masks and laboratory scale star shade masks: design, fabrication and characterization

Kunjithapatham Balasubramanian, Victor White, Karl Yee, Pierre Echternach, Richard Muller, Matthew Dickie, Eric Cady, Camilo Mejia Prada, Daniel Ryan, Ilya Poberezhskiy, Hanying Zhou, Brian Kern, A. J. Riggs, Neil Zimmerman, Dan Sirbu, Stuart Shaklan, Jeremy Kasdin

Proceedings Volume 9605, 96050L (2015) https://doi.org/10.1117/12.2188954

KEYWORDS: Photomasks, Silicon, Reflectivity, Aluminum, Coronagraphy, Semiconducting wafers, Stars, Wavefronts, Point spread functions, Telescopes

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Proceedings Article | 24 September 2012 Paper

Development of fast, background-limited transition-edge sensors for the background-limited infrared/sub-mm spectrograph (BLISS) for SPICA

Andrew Beyer, M. Kenyon, P. Echternach, B. Bumble, M. Runyan, T. Chui, C. Bradford, W. Holmes, J. Bock

Proceedings Volume 8452, 84520G (2012) https://doi.org/10.1117/12.926326

KEYWORDS: Sensors, Superconductors, Spectrometers, Resistance, Optical filters, Infrared sensors, Infrared spectroscopy, Infrared radiation, Spectrographs, Temperature metrology

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Proceedings Article | 21 September 2012 Paper

Progress toward BLISS, the background-limited infrared-submillimeter spectrograph for SPICA

C. Bradford, A. Beyer, M. Kenyon, M. Runyan, B. Bumble, P. Echternach, T. Prouvé, W. Holmes, J. Bock, K. Irwin

Proceedings Volume 8442, 84420P (2012) https://doi.org/10.1117/12.926843

KEYWORDS: Spectroscopy, Galactic astronomy, Sensors, Bolometers, Prototyping, Stars, Infrared spectroscopy, Telescopes, Infrared radiation, Multiplexers

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Proceedings Article | 11 August 2010 Paper

The background-limited infrared-submillimeter spectrograph (BLISS) for SPICA: a design study

C. Bradford, James Bock, Warren Holmes, M. Kenyon, A. Beyer, M. Werner, M. Rud, T. Prouvé, P. Echternach, K. Irwin, S. Cho, M. Harwit, G. Stacey, G. Helou, L. Armus, P. Appleton, J. D. Smith, U. Gorti, G. Rieke, E. Egami, D. Lester, J. Glenn, M. Malkan, D. Dale

Proceedings Volume 7731, 77310S (2010) https://doi.org/10.1117/12.857779

KEYWORDS: Sensors, Spectrometers, Galactic astronomy, Bolometers, Stars, Mirrors, Infrared spectroscopy, Cryogenics, Telescopes, Infrared radiation

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Proceedings Article | 11 August 2010 Paper

The JWST/NIRCam coronagraph flight occulters

John Krist, Kunjithapatham Balasubramanian, Richard Muller, Stuart Shaklan, Douglas Kelly, Daniel Wilson, Charles Beichman, Eugene Serabyn, Yalan Mao, Pierre Echternach, John Trauger, Kurt Liewer

Proceedings Volume 7731, 77313J (2010) https://doi.org/10.1117/12.856488

KEYWORDS: Coronagraphy, James Webb Space Telescope, Coating, Aluminum, Antireflective coatings, Photomasks, Microscopes, Absorbance, Neodymium, Image transmission

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Proceedings Article | 6 August 2010 Paper

Broadband suppression and occulter position sensing at the Princeton occulter testbed

Eric Cady, Kunjithapatham Balasubramanian, Michael Carr, Matthew Dickie, Pierre Echternach, Jeremy Kasdin, Stuart Shaklan, Dan Sirbu, Victor White

Proceedings Volume 7731, 77312F (2010) https://doi.org/10.1117/12.857133

KEYWORDS: Cameras, Photomasks, Charge-coupled devices, CCD cameras, Device simulation, Diffraction, Beam propagation method, Optical simulations, Lenses, Stars

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Proceedings Article | 15 July 2010 Paper

Characterizing SixNy absorbers and support beams for far-infrared/submillimeter transition-edge sensors

A. Beyer, M. Kenyon, P. Echternach, B.-H. Eom, J. Bueno, P. Day, J. Bock, C. Bradford

Proceedings Volume 7741, 774121 (2010) https://doi.org/10.1117/12.857885

KEYWORDS: Sensors, Etching, Wet etching, Resistors, Dry etching, Scanning electron microscopy, Solids, Thermometry, Space telescopes, Spectrographs

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We report on the characterization of Si_xN_y (Si-N) optical absorbers and support beams for transition-edge sensors (TESs). The absorbers and support beams measured are suitable to meet ultra-sensitive noise equivalent power (NEP≤10^-19W/√Hz) and effective response time (τ) requirements (τ≤100ms) for space-borne far-infrared( IR)/submillimeter(sub-mm) spectrometers, such as the Background Limited far-Infrared/Sub-mm Spectrograph (BLISS) and the SpicA FAR-infrared Instrument (SAFARI) for the SPace Infrared telescope for Cosmology and Astrophysics (SPICA). The thermal response time (τ₀) of an absorber suspended by support beams from a lowtemperature substrate depends on the heat capacity (C) of the absorber and the thermal conductance (G) of the support beams (τ₀=C/G). In membrane-isolated TESs for BLISS, the effective response time τ is expected to be a factor of 20 smaller than τ0 because of voltage-biased electrothermal feedback operation and assumption of a reasonable open-loop gain, LI≈20. We present design specifications for the arrays of membrane-isolated ultra-sensitive TESs for BLISS. Additionally, we measured G and τ₀ for two Si-N noise thermometry device (NTD) architectures made using different fabrication processes: (1) a solid membrane Si-N absorber suspended by thin and long Si-N support beams and (2) a wire-mesh Si-N absorber suspended by long, and even thinner, Si-N support beams. The measurements of G and τ₀ were designed to test suitability of the Si-N thermal performance to meet the demands of the two SPICA instruments. The solid membrane NTD architecture is similar to the TES architecture for SAFARI and the mesh membrane NTD is similar to that of BLISS TESs. We report measured values of G and C for several BLISS and SAFARI NTD devices. We observe that the heat capacity of the solid membrane devices can be reduced to the order of 1fJ/K at 65mK for devices that are wet etched by KOH. However, C for these devices is found to be on the order of 100fJ/K for a dry XeF₂ process. The heat capacity is similarly large for the mesh devices produced with a dry XeF₂ etch.

Proceedings Article | 20 August 2009 Paper

Progress on the occulter experiment at Princeton

Eric Cady, Kunjithapatham Balasubramanian, Michael Carr, Matthew Dickie, Pierre Echternach, Tyler Groff, Jeremy Kasdin, Christian Laftchiev, Michael McElwain, Dan Sirbu, Robert Vanderbei, Victor White

Proceedings Volume 7440, 744006 (2009) https://doi.org/10.1117/12.826359

KEYWORDS: Telescopes, Cameras, Space telescopes, Stars, Apodization, Europium, Exoplanets, Manufacturing, Collimation, Stray light

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Proceedings Article | 20 August 2009 Paper

The JWST/NIRCam coronagraph: mask design and fabrication

John Krist, Kunjithapatham Balasubramanian, Charles Beichman, Pierre Echternach, Joseph Green, Kurt Liewer, Richard Muller, Eugene Serabyn, Stuart Shaklan, John Trauger, Daniel Wilson, Scott Horner, Yalan Mao, Stephen Somerstein, Gopal Vasudevan, Douglas Kelly, Marcia Rieke

Proceedings Volume 7440, 74400W (2009) https://doi.org/10.1117/12.826448

KEYWORDS: Coronagraphy, James Webb Space Telescope, Stars, Halftones, Telescopes, Diffraction, Coating, Photomasks, Sapphire, Light scattering

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Proceedings Article | 19 September 2007 Paper

Demonstration of high contrast in 10% broadband light with the shaped pupil coronagraph

Ruslan Belikov, Amir Give'on, Brian Kern, Eric Cady, Michael Carr, Stuart Shaklan, Kunjithapatham Balasubramanian, Victor White, Pierre Echternach, Matt Dickie, John Trauger, Andreas Kuhnert, N. Jeremy Kasdin

Proceedings Volume 6693, 66930Y (2007) https://doi.org/10.1117/12.734976

KEYWORDS: Wavefronts, Coronagraphy, Manufacturing, Speckle, Photomasks, Point spread functions, Control systems, Planets, Optics manufacturing, Imaging systems

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Proceedings Article | 7 July 2006 Paper

Fabrication and characteristics of free-standing shaped pupil masks for TPF-coronagraph

Kunjithapatham Balasubramanian, Pierre Echternach, Matthew Dickie, Richard Muller, Victor White, Daniel Hoppe, Stuart Shaklan, Ruslan Belikov, N. Jeremy Kasdin, Robert Vanderbei, Daniel Ceperley, Andrew Neureuther

Proceedings Volume 6265, 62653N (2006) https://doi.org/10.1117/12.673251

KEYWORDS: Photomasks, Silicon, Etching, Coronagraphy, Deep reactive ion etching, Manufacturing, Stars, Semiconducting wafers, Planets, Diffraction

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Proceedings Article | 22 January 2005 Paper

Electron-beam lithography for micro and nano-optical applications

Daniel Wilson, Richard Muller, Pierre Echternach, Johan Backlund

Proceedings Volume 5720, (2005) https://doi.org/10.1117/12.600784

KEYWORDS: Polymethylmethacrylate, Lithography, Fabrication, Electron beam lithography, Binary data, Analog electronics, Diffraction gratings, Calibration, Semiconducting wafers, Aluminum

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Showing 5 of 19 publications

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