Dr. Pran Mukherjee Profile

Dr. Pran Mukherjee

Research Scientist at MIT KIASR

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Publications (4)

Proceedings Article | 17 September 2012 Paper

Progress in the development of critical-angle transmission gratings

Ralf Heilmann, Alex Bruccoleri, Pran Mukherjee, Mark Schattenburg

Proceedings Volume 8443, 84430W (2012) https://doi.org/10.1117/12.926827

KEYWORDS: Computed tomography, Diffraction gratings, X-rays, Spectrometers, Etching, Deep reactive ion etching, Spectral resolution, Silicon, Semiconducting wafers, Diffraction

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Proceedings Article | 7 October 2011 Paper

Fabrication update on critical-angle transmission gratings for soft x-ray grating spectrometers

Ralf Heilmann, Alex Bruccoleri, Pran Mukherjee, Jonathan Yam, Mark Schattenburg

Proceedings Volume 8147, 81471L (2011) https://doi.org/10.1117/12.895389

KEYWORDS: Computed tomography, Diffraction gratings, Silicon, Etching, Deep reactive ion etching, X-rays, Oxides, Photomasks, Diffraction, Spectrometers

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Proceedings Article | 30 July 2010 Paper

Critical-angle transmission grating spectrometer for high-resolution soft x-ray spectroscopy on the International X-ray Observatory

Ralf Heilmann, John Davis, Daniel Dewey, Mark Bautz, Rick Foster, Alex Bruccoleri, Pran Mukherjee, David Robinson, David Huenemoerder, Herman Marshall, Mark Schattenburg, Norbert Schulz, L. Jay Guo, Alex Kaplan, Russell Schweikart

Proceedings Volume 7732, 77321J (2010) https://doi.org/10.1117/12.856482

KEYWORDS: Mirrors, Spectroscopy, X-rays, Computed tomography, Telescopes, Point spread functions, Spectral resolution, Optical design, Diffraction gratings, Silicon

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Proceedings Article | 31 August 2009 Paper

Development of a critical-angle transmission grating spectrometer for the International X-Ray Observatory

Ralf Heilmann, Minseung Ahn, Marshall Bautz, Richard Foster, David Huenemoerder, Herman Marshall, Pran Mukherjee, Mark Schattenburg, Norbert Schulz, Matthew Smith

Proceedings Volume 7437, 74370G (2009) https://doi.org/10.1117/12.825394

KEYWORDS: Computed tomography, Diffraction gratings, X-rays, Diffraction, Spectroscopy, Telescopes, Silicon, Charge-coupled devices, Etching, Spectral resolution

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