Prasad S. Kelkar
at Univ of Sherbrook
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 29 March 2006 Paper
Jacques Beauvais, Prasad Kelkar, Eric Lavallée, Dominique Drouin, Kien Mun Lau
Proceedings Volume 6153, 615348 (2006) https://doi.org/10.1117/12.656823
KEYWORDS: Silicon, Electron beam lithography, Chromium, Monte Carlo methods, Electron beams, Transistors, Silicon films, Resistance, Plasma etching, Line edge roughness

Proceedings Article | 6 May 2005 Paper
Proceedings Volume 5751, (2005) https://doi.org/10.1117/12.599723
KEYWORDS: Electron beam lithography, Electron beams, Line edge roughness, Semiconducting wafers, Photomasks, Lithography, Systems modeling, Standards development, Line width roughness, Tolerancing

Proceedings Article | 14 May 2004 Paper
Ron Legario, Prasad Kelkar, Jacques Beauvais, Eric Lavallee, Dominique Drouin, Melanie Cloutier, David Turcotte, Pan Yang, Lau Mun, Yousef Awad, Pierre Lafrance
Proceedings Volume 5376, (2004) https://doi.org/10.1117/12.535775
KEYWORDS: Electron beam lithography, Photomasks, Semiconductor lasers, Lithography, Coating, Etching, Silicon, Zone plates, Semiconducting wafers, Electron beams

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