In order to achieve the effective splitting of X-ray, the perfect crystal whose the space of lattice plane comparable to the X-ray wavelength can be used as beam splitter. This beam splitter utilizes the diffraction effect of Laue crystal to accurately manipulate X-ray beam. A stress-free crystal with thin thickness is crucial for high-quality X-ray splitting. The working area of crystal was thinned by acid etching. Additionally, the base of crystal was cut from a floating-zone silicon single-crystal ingot, which prevented the spread of stress to the working area of crystal in fabrication and experiment. The experiment of Laue diffraction was conducted at the synchrotron radiation facility. In order to obtain the inherent rocking curve and consistent imaging field of view, a non-dispersion configuration was employed to match the energy bandwidth of the incident beam with the Laue diffraction crystal. Then diffraction splitting within the energy bandwidth of the Laue crystal was achieved by utilizing a collimator to reduce the divergence of the incident beam. The fine structure of the diffraction curve was measured experimentally, and the slope error of linear fitting between the high-angle and low-angle positions of peaks is less than 0.4%, which satisfies the requirement of stress-free diffraction splitting. The design and characterization of this Laue diffraction crystal provide technical support for various applications, such as X-ray ghost imaging, X-ray multi-projection imaging, and beamline measurement at wavelength.
The performance of the optical elements at-wavelength measurement is affects by the synchrotron radiation beam divergence angle, and it is necessary to modulate a highly collimated X-ray as the measurement beam. In this paper, a multiple-crystal X-ray diffraction system composed by the channel-cut crystal, which is used to suppress the angular divergence of the synchrotron radiation beam. The Si(111) channel-cut crystal should work at the energy range of 10- 18keV, which can suppress the angular divergence of the beam lower than the Darwin width of the double crystals. The divergence angle was measured by the Si(111) analyzer is 2.9″@10keV at the vertical direction and 2.01″@18keV at the horizontal direction. The measurement results shows that the channel-cut crystal can suppress the synchrotron beam divergence angle and provide a high collimated light for the at-wavelength measurement of the optical components.
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