Prof. Rajpal S. Sirohi
Professor
SPIE Involvement:
Author | Editor
Publications (42)

SPIE Journal Paper | 30 April 2020 Open Access
OE, Vol. 59, Issue 04, 040801, (April 2020) https://doi.org/10.1117/12.10.1117/1.OE.59.4.040801
KEYWORDS: Collimation, Interferometry, Interferometers, Mirrors, Prisms, Fringe analysis, Diffraction, Optical engineering, Composites, Spherical lenses

SPIE Journal Paper | 16 August 2013
OE, Vol. 52, Issue 08, 084103, (August 2013) https://doi.org/10.1117/12.10.1117/1.OE.52.8.084103
KEYWORDS: Fourier transforms, Holography, Multiplexing, Interferometers, Holographic interferometry, Lenses, Wavefronts, Collimation, Monochromatic aberrations, Optical engineering

Proceedings Article | 12 October 2006 Paper
Proceedings Volume 6382, 63820L (2006) https://doi.org/10.1117/12.685080
KEYWORDS: Phase shifts, Interferometers, Wave plates, Polarization, Circular polarizers, Optical interferometry, Jones calculus, Polarizers, Phase interferometry, Fringe analysis

Proceedings Article | 7 March 2006 Paper
Proceedings Volume 4101, (2006) https://doi.org/10.1117/12.498448
KEYWORDS: Phase shifts, Ferroelectric materials, Polarization, Phase shifting, Optical interferometry, Phase interferometry, Interferometers, Beam splitters, Interferometry, Fourier transforms

Proceedings Article | 7 March 2006 Paper
Rajpal Sirohi, Baij Gupta
Proceedings Volume 4101, (2006) https://doi.org/10.1117/12.498447
KEYWORDS: Speckle interferometry, Phase shifting, Polarization, Speckle, Photography, Nondestructive evaluation, Fringe analysis, Sensors, Liquids, Charge-coupled devices

Showing 5 of 42 publications
Conference Committee Involvement (3)
Optical Measurement Systems for Industrial Inspection IV
13 June 2005 | Munich, Germany
Optical Metrology in Production Engineering
27 April 2004 | Strasbourg, France
Microsystems Engineering: Metrology and Inspection III
23 June 2003 | Munich, Germany
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