Mr. Raphael Getin Profile

Raphael Getin

IAPPS Engineer at KLA Corp

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Publications (1)

Proceedings Article | 13 March 2018 Paper

Clean focus, dose and CD metrology for CD uniformity improvement

Honggoo Lee , Sangjun Han, Minhyung Hong, Seungyoung Kim, Jieun Lee, DongYoung Lee, Eungryong Oh, Ahlin Choi, Nakyoon Kim, John Robinson, Markus Mengel , Rovira Pablo , Sungchul Yoo, Raphael Getin, Dongsub Choi, Sanghuck Jeon

Proceedings Volume 10585, 105852A (2018) https://doi.org/10.1117/12.2299976

KEYWORDS: Semiconducting wafers, Metrology, Critical dimension metrology, Scanners, Process control, Modulation, Scatterometry, Finite element methods, Signal to noise ratio, Single crystal X-ray diffraction

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