Mr. Raymond J. Soffer Profile

Raymond J. Soffer

Research Scientist at National Research Council Canada

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Author

Publications (4)

Proceedings Article | 6 June 2022 Presentation + Paper

Development of test methods for hyperspectral cameras characterization in the P4001 standards development

Emmet Ientilucci, David Conran, Raymond Soffer, David Perry, Torbjorn Skauli, John Gilchrist, Christopher Durell

Proceedings Volume PC12094, PC1209402 (2022) https://doi.org/10.1117/12.2623490

KEYWORDS: Cameras, Stray light, Standards development, Calibration, Mirrors, Data modeling, Sensors, Optical spheres, Optical filters, Lamps

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Proceedings Article | 2 November 2017 Paper

Spectro-spatial relationship between UAV derived high resolution DEM and SWIR hyperspectral data: application to an ombrotrophic peatland

J. Pablo Arroyo-Mora, Margaret Kalacska, Oliver Lucanus, Raymond Soffer, George Leblanc

Proceedings Volume 10421, 104210P (2017) https://doi.org/10.1117/12.2277874

KEYWORDS: Vegetation, Ecosystems, Short wave infrared radiation, Atomic force microscopy, Unmanned aerial vehicles, Carbon dioxide, Photogrammetry, Climatology, Methane, Hydrology

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Proceedings Article | 5 October 2017 Paper

A geospatial database model for the management of remote sensing datasets at multiple spectral, spatial, and temporal scales

Gabriela Ifimov, Grace Pigeau, J. Pablo Arroyo-Mora, Raymond Soffer, George Leblanc

Proceedings Volume 10428, 104281Q (2017) https://doi.org/10.1117/12.2278510

KEYWORDS: Databases, Data modeling, Remote sensing, Field spectroscopy, Data storage, Hyperspectral imaging, Calibration, Airborne remote sensing, Data acquisition, Data integration

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Proceedings Article | 18 November 1998 Paper

Characteristics of a custom integrated bolometer array

Paul Thomas, Philip Duggan, Timothy Pope, Peter Sinclair, Raymond Soffer, Alexander Evstigneev, Nadine Zackodnick, Matthew George

Proceedings Volume 3437, (1998) https://doi.org/10.1117/12.331339

KEYWORDS: Resistance, Bolometers, Sensors, Prototyping, Digital electronics, Electronics, Temperature metrology, Semiconductors, Detector arrays, Control systems

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