Dr. Ricardo Oliva-García Profile

Dr. Ricardo Oliva-García

at Wooptix S L

SPIE Involvement:

Author

Publications (9)

Proceedings Article | 27 May 2022 Presentation + Paper

A fast but ill-conditioned formal inverse to Radon transforms in 2D and 3D

Ricardo Oliva-García, José Marichal-Hernández, Óscar Gómez-Cárdenes, Nelson Suárez-Martín, José Rodríguez-Ramos

Proceedings Volume 12102, 1210209 (2022) https://doi.org/10.1117/12.2617409

KEYWORDS: Radon transform, Transform theory, Radon, Point spread functions, MATLAB, Medical imaging, Deconvolution

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Proceedings Article | 27 May 2022 Presentation + Paper

A local real-time bar detector based on the multiscale Radon transform

Ricardo Oliva-García, Óscar Gómez-Cárdenes, José Marichal-Hernández, Javier Martín-Hernández, Jonas Phillip-Lüke, José Rodríguez-Ramos

Proceedings Volume 12102, 121020A (2022) https://doi.org/10.1117/12.2617411

KEYWORDS: Sensors, Radon transform, Digital signal processing, Mobile devices, Detection and tracking algorithms, Image processing, Image segmentation, System on a chip, Lanthanum, Hough transforms

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Proceedings Article | 5 March 2022 Presentation + Paper

New high repeatability wafer geometry measurement technique for full 200mm and 300mm blank wafers

Juan Trujillo-Sevilla, Álvaro Pérez-García, Óscar Casanova-González, Miriam Velasco-Ocaña, Sabato Ceruso, Ricardo Oliva-García, Óscar Gómez-Cárdenes, Javier Martín-Hernández, Alex Roqué-Velasco, José Manuel Rodríguez-Ramos, Jan Gaudestad

Proceedings Volume 12008, 120080A (2022) https://doi.org/10.1117/12.2607315

KEYWORDS: Semiconducting wafers, Photovoltaics, Silicon, Cameras, Data acquisition, Gaussian filters, Wavefronts, Lithography, Imaging systems

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Proceedings Article | 28 October 2021 Presentation + Paper

Stria measurement using wave front phase imaging on a transparent plate

Juan M. Trujillo-Sevilla, Oscar Casanova-González, Miriam Velasco-Ocaña, Sabato Ceruso, Ricardo Oliva-García, Óscar Gómez-Cárdenes, Javier Martín-Hernández, Alex Roqué-Velasco, Alvaro Pérez-García, José Manuel Rodríguez-Ramos, Jan Gaudestad

Proceedings Volume 11889, 118891I (2021) https://doi.org/10.1117/12.2605328

KEYWORDS: Wavefronts, Glasses, Phase imaging, Spatial frequencies, Refractive index, Manufacturing, Visualization, Reflectivity, Optical sensors, Light wave propagation

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Proceedings Article | 12 October 2021 Poster + Presentation + Paper

New metrology technique for measuring wafer geometry on a full 300mm silicon wafer

Juan Trujillo-Sevilla, Óscar Casanova-González, Miriam Velasco-Ocaña, Sabato Ceruso, Ricardo Oliva-García, Óscar Gómez-Cárdenes, Javier Martín-Hernández, Alex Roqué-Velasco, Álvaro Pérez-García, Jose Manuel Ramos-Rodríguez, Jan Gaudestad

Proceedings Volume 11854, 118541B (2021) https://doi.org/10.1117/12.2605516

KEYWORDS: Semiconducting wafers, Silicon, Photovoltaics, Gaussian filters, Data acquisition, Wavefronts, Metrology, Cameras, Overlay metrology, Image sensors

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Proceedings Article | 27 April 2020 Presentation

Using partial stages of Radon transform to detect non straight edges (Conference Presentation)

Javier Martin-Hernandez, Ángela Hernández Delgado, Ricardo Oliva-García, Oscar Gomez-Cardenes, José Gil Marichal-Hernandez

Proceedings Volume 11400, 1140004 (2020) https://doi.org/10.1117/12.2557265

KEYWORDS: Radon transform, Edge detection, Radon, Transform theory

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Proceedings Article | 22 April 2020 Presentation + Paper

Free view point generation based on depth maps computed by a single camera

Ricardo Oliva-García, Jan Gaudestad, Javier Martin-Hernandez, Ángela Hernández-Delgado, Óscar Gómez-Cárdenes, Jonas Lüke, José M. Rodríguez-Ramos

Proceedings Volume 11402, 114020P (2020) https://doi.org/10.1117/12.2558063

KEYWORDS: Cameras, Matrices, Head, 3D image processing, Image interpolation

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Proceedings Article | 14 May 2019 Paper

Calibration method applied to a tunable tensor display system

David Carmona-Ballester, Viana Guadalupe-Suárez, Juan Trujillo-Sevilla, Sergio Bonaque-González, Ricardo Oliva-García, Jose Marichal-Hernández, Miguel Sicilia-Cabrera, Lara Díaz-García, Jose Rodríguez-Ramos

Proceedings Volume 10997, 1099709 (2019) https://doi.org/10.1117/12.2518865

KEYWORDS: Calibration, LCDs, Computing systems, Lanthanum, Liquid crystals, Polarizers, Displays, Multilayers, Prototyping, Polarization

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