Dr. Richard Koops Profile

Dr. Richard Koops

at VSL Dutch Metrology Institute

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Author

Publications (7)

Proceedings Article | 18 June 2024 Paper

Universal Fourier optics model for virtual confocal microscopes

Felix Rosenthal, Tobias Pahl, Tim Eckhardt, Sebastian Hagemeier, Jonas Compagnone, Tim Czasch, Michael Diehl, Richard Koops, Peter Lehmann

Proceedings Volume 12997, 129970N (2024) https://doi.org/10.1117/12.3017579

KEYWORDS: 3D modeling, 3D metrology, Confocal microscopy, Microscopes, 3D image processing, Fourier optics, Modeling

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Proceedings Article | 15 March 2023 Presentation

Metrological flow cytometry to traceably measure the size and refractive index of single nanoparticles (Conference Presentation)

Martine Kuiper, Richard Koops, Rienk Nieuwland, Ton van Leeuwen, Edwin van der Pol

Proceedings Volume PC12383, PC1238307 (2023) https://doi.org/10.1117/12.2650545

KEYWORDS: Nanoparticles, Metrology, Refractive index, Particles, Flow cytometry, Scatter measurement, Optical testing, Light scattering, Precision measurement, Mie scattering

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Proceedings Article | 6 March 2023 Presentation

New method for traceable refractive index determination by measuring the angle of minimum deviation

Martine Kuiper, Richard Koops, Rienk Nieuwland, Ton van Leeuwen, Edwin van der Pol

Proceedings Volume PC12370, PC1237002 (2023) https://doi.org/10.1117/12.2650587

KEYWORDS: Refractive index, Environmental sensing, Solids, Liquids, Flow cytometry, Temperature metrology, Silica, Prisms, Particles, Nanoparticles

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Proceedings Article | 20 November 2003 Paper

Alternative measuring modes for scanning probe instrumentation

K. Koops, Kai Dirscherl

Proceedings Volume 5190, (2003) https://doi.org/10.1117/12.503069

KEYWORDS: 3D metrology, Scanning probe microscopy, Data acquisition, Inspection, Scanning probe microscopes, Calibration, Image analysis, Scanning tunneling microscopy, Image processing, Nanotechnology

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Proceedings Article | 20 November 2003 Paper

Developments on the NMi-VSL traceable scanning probe microscope

Kai Dirscherl, K. Koops

Proceedings Volume 5190, (2003) https://doi.org/10.1117/12.503082

KEYWORDS: Interferometers, Atomic force microscopy, Scanning probe microscopes, Control systems, Scanners, Clocks, Head, Feedback control, Feedback loops, Mirrors

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Proceedings Article | 20 November 2003 Paper

Development of a digital controller for iodine stabilized lasers

K. Koops, Robbert Bergmans, Steven van den Berg

Proceedings Volume 5190, (2003) https://doi.org/10.1117/12.503056

KEYWORDS: Digital signal processing, Laser stabilization, Modulation, Human-machine interfaces, Absorption, Photodiodes, Frequency combs, Process control, Signal processing, Iodine cells

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Proceedings Article | 22 October 2001 Paper

Improved calibration of an interference microscope

Richard Koops

Proceedings Volume 4401, (2001) https://doi.org/10.1117/12.445634

KEYWORDS: Microscopes, Calibration, Mirrors, Interferometers, Wavefronts, Objectives, Laser stabilization, Error analysis, Mach-Zehnder interferometers, Mercury

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Showing 5 of 7 publications

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