Prof. Salvador Bosch Puig
Full Professor at Univ de Barcelona
SPIE Involvement:
Author
Publications (50)

Proceedings Article | 26 June 2017 Paper
Salvador Bosch, Santiago Vallmitjana, Antonio Marzoa, Justo Arines, Eva Acosta
Proceedings Volume 10333, 1033318 (2017) https://doi.org/10.1117/12.2271322
KEYWORDS: Wavefront sensors, Wave propagation, Beam propagation method, Zernike polynomials, Modeling, Wavefronts, Ray tracing, Microlens, Geometrical optics, MATLAB, Sensors, Beam shaping

Proceedings Article | 28 August 2015 Paper
Proceedings Volume 9547, 954731 (2015) https://doi.org/10.1117/12.2187807
KEYWORDS: Particles, Electroluminescent displays, Plasmons, Spherical lenses, Electromagnetism, Plasmonics, Nanoparticles, Metals, Mie scattering, Silver

Proceedings Article | 6 May 2010 Paper
Proceedings Volume 7723, 77231O (2010) https://doi.org/10.1117/12.854374
KEYWORDS: Wavefronts, Optical transfer functions, Imaging systems, Phase modulation, LCDs, Point spread functions, Quality measurement, Algorithms, CCD cameras, Image processing

Proceedings Article | 4 May 2010 Paper
Proceedings Volume 7723, 772307 (2010) https://doi.org/10.1117/12.854541
KEYWORDS: Spatial light modulators, Wavefronts, Imaging systems, Point spread functions, Calibration, Image filtering, Charge-coupled devices, Phase shift keying, Optical aberrations, Liquid crystals

Proceedings Article | 22 August 2009 Paper
Proceedings Volume 7429, 74290L (2009) https://doi.org/10.1117/12.826207
KEYWORDS: Wavefronts, Wavefront sensors, Sensors, Ray tracing, Zernike polynomials, Light wave propagation, Visualization, Point spread functions, Monochromatic aberrations, Optical sensors

Showing 5 of 50 publications
Conference Committee Involvement (6)
Advances in Optical Thin Films III
2 September 2008 | Glasgow, Scotland, United Kingdom
Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies III
28 August 2007 | San Diego, California, United States
Advances in Optical Thin Films II
13 September 2005 | Jena, Germany
Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies II
2 August 2005 | San Diego, California, United States
Advances in Optical Thin Films
30 September 2003 | St. Etienne, France
Showing 5 of 6 Conference Committees
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