Prof. Sanjay Krishna
Professor at Ohio State Univ
SPIE Involvement:
Conference Program Committee | Author | Student Chapter Advisor
Websites:
Profile Summary

Sanjay Krishna is the George R Smith Professor of Engineering in the ECE department at the Ohio State University. He was previously the Director of the Center for High Technology Materials and Professor and Regents Lecturer in the Department of Electrical and Computer Engineering at the University of New Mexico. Sanjay received his M.S. in Electrical Engineering in 1999 and PhD in Applied Physics in 2001 from the University of Michigan. He joined UNM as a tenure track faculty member in 2001. His group is involved with the development of next generation infrared detectors, arrays and imagers. Sanjay received the Gold Medal from IIT, Madras, Ralph Power Junior Faculty Award, IEEE Outstanding Engineering Award, ECE Department Outstanding Researcher Award, School of Engineering Jr Faculty Teaching Excellence Award, NCMR-DIA Chief Scientist Award for Excellence, the NAMBE Young Investigator Award, IEEE-NTC, SPIE Early Career Achievement Award and the ISCS Young Scientist Award. He was also awarded the UNM Teacher of the Year and the UNM Regents Lecturer award. Sanjay has more than 200 peer-reviewed journal articles (h-index=45), two book chapters and ten issued patents. He is the co-founder and CTO of SK Infrared, a start-up involved with the use of IR imaging for dual use applications including early detection of skin cancer. He is a Fellow of IEEE, OSA and SPIE.
Publications (135)

Proceedings Article | 11 March 2024 Presentation + Paper
Bingtian Guo, Baolai Liang, Sheikh Ahmed, Sanjay Krishna, Joe Campbell
Proceedings Volume 12880, 128800C (2024) https://doi.org/10.1117/12.3001599
KEYWORDS: Indium gallium arsenide, Refractive index, Absorption, Alloys, Spectroscopic ellipsometry, Short wave infrared radiation, Photodetectors, Ellipsometry, Optoelectronic devices, Monolayers

Proceedings Article | 8 March 2024 Presentation + Paper
Yifan Liu, Xiao Jin, Seunghyun Lee, Hyemin Jung, Harry I. Lewis, Bingtian Guo, Sri Kodati, Mariah Schwartz, Christopher Grein, T. Ronningen, Joe Campbell, Sanjay Krishna, John P. David
Proceedings Volume 12882, 128820O (2024) https://doi.org/10.1117/12.3011687
KEYWORDS: Avalanche photodetectors, Avalanche photodiodes, Ionization, Dark current

Proceedings Article | 13 June 2023 Poster + Paper
Proceedings Volume 12534, 125341Z (2023) https://doi.org/10.1117/12.2663859
KEYWORDS: Carrier dynamics, Infrared materials, Material characterization, Semiconductor materials, Temperature metrology, Doping, Dark current, Short wave infrared radiation, Photodiodes, Avalanche photodetectors, Reflectivity, Microwave radiation

Proceedings Article | 13 June 2023 Presentation + Paper
Manisha Muduli, Mariah Schwartz, Nathan Gajowski, Seunghyun Lee, Sanjay Krishna
Proceedings Volume 12534, 125340A (2023) https://doi.org/10.1117/12.2663602
KEYWORDS: Zinc, Zinc oxide, Diffusion, Atomic layer deposition, Avalanche photodetectors, Annealing, Fabrication, Diodes, Dark current, Superlattices

Proceedings Article | 17 March 2023 Presentation
Proceedings Volume PC12425, PC124250F (2023) https://doi.org/10.1117/12.2657565
KEYWORDS: LIDAR, Avalanche photodiodes, Avalanche photodetectors, Signal to noise ratio, Mercury cadmium telluride, Infrared sensors, Infrared radiation, Three dimensional sensing, Short wave infrared radiation, Sensors

Showing 5 of 135 publications
Conference Committee Involvement (40)
Image Sensing Technologies: Materials, Devices, Systems, and Applications XII
13 April 2025 | Orlando, Florida, United States
Optical Interconnects and Packaging 2025
28 January 2025 | San Francisco, California, United States
Image Sensing Technologies: Materials, Devices, Systems, and Applications XI
22 April 2024 | National Harbor, Maryland, United States
Optical Interconnects XXIV
29 January 2024 | San Francisco, California, United States
Image Sensing Technologies: Materials, Devices, Systems, and Applications X
1 May 2023 | Orlando, Florida, United States
Showing 5 of 40 Conference Committees
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