Dr. Sergey Pryshchep
at Rensselaer Polytechnic Institute
SPIE Involvement:
Author
Publications (1)

SPIE Journal Paper | 14 February 2020
JNP, Vol. 14, Issue 01, 016009, (February 2020) https://doi.org/10.1117/12.10.1117/1.JNP.14.016009
KEYWORDS: Stimulated emission depletion microscopy, Image resolution, Point spread functions, Super resolution, Data modeling, Confocal microscopy, Deconvolution, Microscopes, Image enhancement, Microscopy

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