Mr. Seth H. Pappas Profile

Seth H. Pappas

Product Engineering Manager at SemiNex Corp

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Author

Publications (5)

Proceedings Article | 15 June 2023 Presentation + Paper

Eye-safe high-reliability triple junction laser diode for long-range rangefinder and LiDAR

Sidi Aboujja, Seth Pappas, Daniel Chu

Proceedings Volume 12515, 1251502 (2023) https://doi.org/10.1117/12.2663610

KEYWORDS: Semiconductor lasers, LIDAR, Reliability, Pulsed laser operation, High power lasers, Failure analysis

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Proceedings Article | 14 March 2023 Presentation + Paper

High reliability of 1550nm triple junction laser diode for long-range automotive LiDAR

Sidi Aboujja, Seth Pappas, Daniel Chu

Proceedings Volume 12403, 1240308 (2023) https://doi.org/10.1117/12.2649168

KEYWORDS: Semiconductor lasers, LIDAR, Reliability, Fiber lasers, Industry, Current confinement, High power lasers, Failure analysis, Diodes, Design and modelling

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Proceedings Article | 18 June 2013 Paper

Thin film coating analysis using a novel IR camera and a broadband Echelle spectrograph

Seth Pappas, Burt Beardsley, George Ritchie

Proceedings Volume 8704, 87042F (2013) https://doi.org/10.1117/12.2016683

KEYWORDS: Spectrographs, Sensors, Infrared cameras, Silicon, Cameras, Spectral resolution, Germanium, Thin film coatings, Coating, Silica

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Proceedings Article | 4 May 2010 Paper

Wide-band imaging for enhanced day and night vision

Conor Rafferty, Clifford King, Bryan Ackland, Jason Sproul, Ingvar Aberg, Jay O'Neill, T. Sriram, Corbin Godek, Analisa Lattes, Seth Pappas, Arnie Buck, Vasilije Jovanovic

Proceedings Volume 7660, 76600M (2010) https://doi.org/10.1117/12.850514

KEYWORDS: Cameras, Imaging systems, Sensors, Electron multiplying charge coupled devices, Germanium, Video, Photons, Interference (communication), Short wave infrared radiation, Transistors

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Proceedings Article | 8 June 2006 Paper

Correction of large amplitude wavefront aberrations

S. Cornelissen, P. Bierden, T. Bifano, R. Webb, S. Burns, S. Pappas

Proceedings Volume 6018, 601811 (2006) https://doi.org/10.1117/12.669370

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