Dr. Srinivas Kuchipudi
at Advanced Systems Lab
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 9 April 2007 Paper
Jhumur Lahiri, K. Srinivas, Ahmed Siddiqui, Vladimir Vavilov
Proceedings Volume 6541, 65410S (2007) https://doi.org/10.1117/12.718632
KEYWORDS: Composites, Inspection, Signal to noise ratio, Defect detection, Statistical analysis, Data modeling, Algorithm development, Lamps, Anisotropy, Statistical modeling

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