Dr. Steven Parsons Profile

Dr. Steven Parsons

at Open Univ

SPIE Involvement:

Author

Publications (5)

SPIE Journal Paper | 10 August 2024 Open Access

Impact of particle passage and focusing from micro-pore optics for radiation damage estimates

Michael W. Hubbard, Thomas Buggey, David Hall, Charly Feldman, Jonathan Keelan, Oliver Hetherington, Steven Parsons, Timothy Arnold, Andrew Holland

JATIS, Vol. 10, Issue 03, 034003, (August 2024) https://doi.org/10.1117/12.10.1117/1.JATIS.10.3.034003

KEYWORDS: Particles, Simulations, Charge-coupled devices, Equipment, Eye, X-ray optics, Monte Carlo methods, Space operations, X-rays, Image sensors

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SPIE Journal Paper | 26 May 2022

Developing the active trap model for charge-coupled device charge transfer optimization in large-scale space missions

Thomas W. Buggey, Matthew Soman, David Hall, Nathan Bush, Steven Parsons, Oliver Hetherington, Andrew Holland

JATIS, Vol. 8, Issue 02, 028003, (May 2022) https://doi.org/10.1117/12.10.1117/1.JATIS.8.2.028003

KEYWORDS: Charge-coupled devices, Instrument modeling, Optimization (mathematics), X-rays, Electrodes, Space operations, Temperature metrology, Sensors, Data modeling, Performance modeling

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Proceedings Article | 13 December 2020 Presentation + Paper

Developing the active trap model for CCD charge transfer optimisation in large-scale space missions

T. Buggey, M. Soman, D. Hall, S. Parsons, N. Bush, O. Hetherington, G. Randall, M. Leese, A. Holland

Proceedings Volume 11454, 114541F (2020) https://doi.org/10.1117/12.2561399

KEYWORDS: Charge-coupled devices, Solar radiation models, Space operations, Data modeling, Magnetosphere, Fourier transforms, Testing and analysis, Solar processes, Performance modeling, Data acquisition

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Proceedings Article | 13 December 2020 Presentation + Paper

Processing x-ray data on board the SMILE SXI

George Randall, Steven Parsons, David Hall, Thomas Buggey, Oliver Hetherington, Mark Leese, Andrew Holland, Dean Yeoman, Matthew Soman

Proceedings Volume 11454, 114540T (2020) https://doi.org/10.1117/12.2560339

KEYWORDS: X-rays, Solar processes, Imaging systems, X-ray imaging, Space operations, Data modeling, Magnetosphere, Ultraviolet radiation, Plasma, Ions

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Proceedings Article | 13 December 2020 Presentation + Paper

Radiation damage testing status of the CCDs for the SMILE SXI

Steven Parsons, David Hall, Andrew Holland, Peter Verhoeve, Steven Sembay, George Randall, Oliver Hetherington, Dean Yeoman, Thomas Buggey, Matthew Soman

Proceedings Volume 11454, 114540Q (2020) https://doi.org/10.1117/12.2560337

KEYWORDS: Radiation effects, Charge-coupled devices, Cryogenics, Solar processes, Magnetosphere, X-rays, Space operations, Satellite imaging, Satellites, X-ray imaging

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The joint European Space Agency and Chinese Academy of Sciences Solar wind Magnetosphere Ionosphere Link Explorer mission (SMILE) aims to develop a global scale understanding of the interaction between the solar weather and the Earth’s magnetosphere-ionosphere. The soft X-ray imager (SXI) is one of the instruments on board and will observe photons emitted in the 200 eV to 2000 eV energy range from the solar wind charge exchange process using two large 4510 x 4510 pixel CCD370s as a focal plane. The CCD370s take their design and qualification heritage from similar sensors being used in the PLATO mission, with specific modifications to optimize their performance in this soft X-ray energy range. SMILE will orbit Earth in a highly elliptical orbit and will pass through the radiation belts every 52 hours. The trapped and solar protons present will gradually damage the CCDs throughout the 3-year mission and degrade their performance. To understand the impact the damage has on the devices a series of proton radiation campaigns are being undertaken. These campaigns are being performed with flight-like SMILE CCDs, and functionally similar PLATO devices, with follow-up characterization across from -130 to -85 °C. The most recent irradiation campaign has been completed using a PLATO CCD280 kept below -85 °C for irradiation and characterization, and the results show that the measured parallel charge transfer inefficiency varies with temperature between 1x10^-4 and 4x10^-4 in unbinned full-frame readout mode. The effect of temperature annealing up to -85 °C on the parallel charge transfer inefficiency has also been assessed and shows that no temperature-dependent annealing of the radiation-induced damage has been observed. A similar behavior is expected to be seen in the SMILE devices, albeit with an anticipated improvement by a factor 3-4 due to the modifications made to the design. Thus, results indicate the SMILE CCD370s will meet the performance requirements of the SMILE SXI instrument.

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