Mr. Subong Shon Profile

Subong Shon

at SAMSUNG Electronics Co., Ltd.

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Author

Publications (2)

Proceedings Article | 10 April 2024 Presentation + Paper

Interactive image annotation and AI-assisted segmentation of TEM images for automatic CD measurement

Dongok Kim, Wonhee Lee, Yeny Yim, Byeongkyu Cha, Hansaem Park, Subong Shon, Myungjun Lee

Proceedings Volume 12955, 129550Y (2024) https://doi.org/10.1117/12.3009407

KEYWORDS: Image segmentation, Transmission electron microscopy, Image processing, Metrology, Electron microscopes, Active learning

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Proceedings Article | 13 June 2022 Presentation

Automatic beam optimization technique based on beam profile deconvolution for scanning electron microscopy

Yunje Cho, Subong Shon, Yeny Yim, Changhoon Choi, Myungjun Lee

Proceedings Volume PC12053, PC120530B (2022) https://doi.org/10.1117/12.2612446

KEYWORDS: Scanning electron microscopy, Deconvolution, Monochromatic aberrations, Image processing, Resolution enhancement technologies, Mathematics, Image resolution, Image quality, Image enhancement, Distortion

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