Taewan Kim
at Samsung Electronics
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 11 March 2020 Presentation
Proceedings Volume 11249, 112490M (2020) https://doi.org/10.1117/12.2551033
KEYWORDS: Super resolution, Holography, Phase retrieval, Imaging systems, Microscopy, Image resolution, Reconstruction algorithms, Biomedical optics, Inspection, Diffraction

Proceedings Article | 9 March 2020 Presentation
Jaehyeon Son, Seung Beom Park, Kyungwon Yun, Taewan Kim, Jaehwang Jung, Myungjun Lee
Proceedings Volume 11245, 1124506 (2020) https://doi.org/10.1117/12.2551036
KEYWORDS: Holography, Microscopy, Super resolution, Image resolution, Microscopes, Semiconductors, Stereoscopy, Optical semiconductors, Imaging devices, Wafer-level optics

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