Dr. Takahiro Tanaka Profile

Dr. Takahiro Tanaka

at National Institute of Advanced Industrial Science and Technology

SPIE Involvement:

Author

Publications (2)

Proceedings Article | 18 April 2021 Presentation

Power meters and fluorescence intensity monitors as intensity diagnostics in the LCLS-II X-ray instruments

Philip Heimann, Stefan Moeller, Matthew Seaberg, Peter Walter, William Schlotter, David Fritz, Andrey Sorokin, Fini Jastrow, Kai Tiedtke, Takahiro Tanaka

Proceedings Volume 11776, 117760P (2021) https://doi.org/10.1117/12.2589188

Read Abstract +

Proceedings Article | 24 April 2019 Paper

Pulse power measurements and attenuator characterization of the hard X-ray beamline at the Linac Coherent Light Source

Sanghoon Song, Roberto Alonso-Mori, Matthieu Chollet, Yiping Feng, James Glownia, Henrik Lemke, Marcin Sikorski, Diling Zhu, Stefan Moeller, Hae Ja Lee, Mark Hunter, Gabriella Carini, Kai Tiedtke, Ulf Jastrow, Andrey Sorokin, Mathias Richter, Shigeki Owada, Kensuke Tono, Norio Saito, Takahiro Tanaka, Masahiro Kato, Makina Yabashi, Aymeric Robert

Proceedings Volume 11038, 1103810 (2019) https://doi.org/10.1117/12.2520827

KEYWORDS: X-rays, Power meters, Hard x-rays, X-ray detectors, Diagnostics, Free electron lasers

Read Abstract +

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases

Search In:

Publication Years