Dr. Thomas J. Sanders Profile

Dr. Thomas J. Sanders

Director of Operations at AET Inc

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Author

Publications (11)

Proceedings Article | 5 August 2004 Paper

Two-color HgCdTe focal plane detector simulation

Thomas Sanders, Glenn Hess, Scott Eisert

Proceedings Volume 5407, (2004) https://doi.org/10.1117/12.542342

KEYWORDS: Sensors, Mercury cadmium telluride, Staring arrays, Diodes, Systems modeling, 3D modeling, Mathematical modeling, Instrument modeling, Infrared sensors, Device simulation

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Proceedings Article | 10 October 2003 Paper

HgCdTe focal plane array cost modeling

Thomas Sanders, Glenn Hess

Proceedings Volume 5074, (2003) https://doi.org/10.1117/12.485635

KEYWORDS: Sensors, Staring arrays, Semiconducting wafers, Diodes, Semiconductors, Infrared radiation, Mercury cadmium telluride, Visible radiation, Liquid phase epitaxy, Infrared detectors

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Proceedings Article | 10 October 2001 Paper

Modeling and test of pixel cross-talk in HgCdTe focal plane arrays

Thomas Sanders, E. Caraway, Glenn Hess, Gwendolyn Newsome, Theodore Fischer

Proceedings Volume 4369, (2001) https://doi.org/10.1117/12.445348

KEYWORDS: Diodes, Staring arrays, Mercury cadmium telluride, Instrument modeling, Heterojunctions, Sensors, Semiconductors, Performance modeling, Cadmium, Visual process modeling

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Proceedings Article | 10 September 2001 Paper

Focal plane array design using IR-SIM software system

Glenn Hess, Thomas Sanders, Gwendolyn Newsome, Theodore Fischer

Proceedings Volume 4372, (2001) https://doi.org/10.1117/12.439143

KEYWORDS: Staring arrays, Sensors, Human-machine interfaces, Heterojunctions, Mercury cadmium telluride, Instrument modeling, Interfaces, Computer simulations, Data modeling, Readout integrated circuits

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Proceedings Article | 18 July 2000 Paper

2DEG channel-dependent model for Hg1-xCdxTe-based pseudomorphic HEMTs

Hang-Ming Dai, Thomas Sanders

Proceedings Volume 4042, (2000) https://doi.org/10.1117/12.391910

KEYWORDS: Mercury cadmium telluride, Field effect transistors, Temperature metrology, Instrument modeling, Computer simulations, Copper, Silicon, Capacitance, Cadmium, Crystals

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Proceedings Article | 17 July 2000 Paper

HgCdTe double-layer heterojunction detector device

Glenn Hess, Thomas Sanders

Proceedings Volume 4028, (2000) https://doi.org/10.1117/12.391748

KEYWORDS: Heterojunctions, Mercury cadmium telluride, Staring arrays, Sensors, Semiconductors, Instrument modeling, Visual process modeling, Cadmium, Quantum efficiency, Doping

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Proceedings Article | 17 July 2000 Paper

STADIUM FLIR: a software tool for FLIR92 and ACQUIRE

Glenn Hess, Thomas Sanders

Proceedings Volume 4030, (2000) https://doi.org/10.1117/12.391774

KEYWORDS: Forward looking infrared, Electro optical modeling, Systems modeling, Thermal modeling, Data acquisition, Performance modeling, Minimum resolvable temperature difference, Statistical analysis, Imaging systems, Human-machine interfaces

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Proceedings Article | 17 July 2000 Paper

Computation for crosstalk effects in p-on-n Hg1-xCdxTe heterojunction IRFPA radiated by using uniformly parallel light

Hang-Ming Dai, Thomas Sanders

Proceedings Volume 4028, (2000) https://doi.org/10.1117/12.391749

KEYWORDS: Diodes, Instrument modeling, 3D modeling, Mercury cadmium telluride, Heterojunctions, Electrons, Infrared radiation, Quantum efficiency, Finite element methods, Error analysis

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Proceedings Article | 22 June 1999 Paper

New IRFPA device model

Glenn Hess, Davy Dai, Thomas Sanders, Gwendolyn Newsome, Theodore Fischer

Proceedings Volume 3696, (1999) https://doi.org/10.1117/12.351192

KEYWORDS: Instrument modeling, Sensors, Heterojunctions, Visual process modeling, Infrared sensors, Performance modeling, Data modeling, Mercury cadmium telluride, Infrared detectors, Physics

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Proceedings Article | 11 September 1997 Paper

STADIUM SOI reliability simulator for the analysis of hot-electron and ESD-induced degradation in nonisothermal devices

David Lee, Thomas Sanders

Proceedings Volume 3216, (1997) https://doi.org/10.1117/12.284692

KEYWORDS: Reliability, Statistical analysis, Instrument modeling, Silicon films, Device simulation, Failure analysis, Diffusion, Oxides, Manufacturing, Molybdenum

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Proceedings Article | 16 June 1997 Paper

3D focal plane array modeling for IRFPA process, operation, and performance simulations

Glenn Hess, Thomas Sanders, Hang-Ming Dai, Gwendolyn Newsome, Theodore Fischer

Proceedings Volume 3063, (1997) https://doi.org/10.1117/12.276083

KEYWORDS: 3D modeling, Sensors, Performance modeling, Statistical modeling, Visual process modeling, Staring arrays, Instrument modeling, Process modeling, Infrared sensors, Heterojunctions

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Showing 5 of 11 publications

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