Mr. Tomasz Lizak Profile

Tomasz Lizak

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Publications (5)

Proceedings Article | 1 October 2018 Paper

Design and technology of copper comb capacitors

M. Szypulski, D. Zarzeczny, T. Lizak, K. Muzyka, A. Kociubiński, M. Prendecka, T. Małecka-Massalska

Proceedings Volume 10808, 108085N (2018) https://doi.org/10.1117/12.2501736

KEYWORDS: Electrodes, Capacitors, Copper, Sputter deposition, Resistance, In vitro testing, Sensing systems, Gold, Computer aided design, Optical lithography

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Proceedings Article | 1 October 2018 Paper

Modeling and simulation of nichrome microheater on polycarbonate substrate

T. Lizak, M. Szypulski, D. Zarzeczny, K. Muzyka, A. Kociubiński

Proceedings Volume 10808, 1080859 (2018) https://doi.org/10.1117/12.2501556

KEYWORDS: Electrodes, Silicon, Resistance, Modeling and simulation, 3D modeling, Thermal modeling, In vitro testing, Titanium, Dielectrics, Structural design

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Proceedings Article | 1 October 2018 Paper

Design and technology of titanium comb capacitor

D. Zarzeczny, M. Szypulski, T. Lizak, K. Muzyka, A. Kociubiński, M. Prendecka, T. Małecka-Massalska

Proceedings Volume 10808, 1080857 (2018) https://doi.org/10.1117/12.2501551

KEYWORDS: Titanium, Electrodes, Resistance, Capacitors, Optical lithography, Microelectromechanical systems, Sputter deposition, Analytical research, Design for manufacturability

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Proceedings Article | 28 September 2016 Paper

Nichrome micro-heaters as actuators for microfluidic sensors

M. Gęca, T. Lizak, A. Kociubiński, M. Borecki, M. Korwin-Pawlowski

Proceedings Volume 10031, 1003126 (2016) https://doi.org/10.1117/12.2249184

KEYWORDS: Sensors, Actuators, Microfluidics, Capillaries, Resistance, Control systems, Silicon, Thin films, Temperature metrology, Control systems design

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Proceedings Article | 11 September 2015 Paper

Reliability tests of ultrasonic and thermosonic wire bonds

T. Lizak, A. Kociubiński

Proceedings Volume 9662, 966245 (2015) https://doi.org/10.1117/12.2205412

KEYWORDS: Ultrasonics, Gold, Reliability, Aluminum, Scanning electron microscopy, Integrated circuits, Lead, Semiconductors, Copper, Ceramics

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