Dr. Toru Fujii Profile

Dr. Toru Fujii

Manager at Nikon Corp

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Publications (10)

Proceedings Article | 4 March 2019 Paper

Multispectral Mueller matrix imaging dark-field microscope for biological sample observation

Naooki Saito, Kenji Sato, Toru Fujii, Heather Durko, Goldie Goldstein, Alton Phillips, Joceline Dominguez-Cooks, Gabrielle Hutchens, Harrison Thurgood, Photini Rice, Jennifer Barton

Proceedings Volume 10890, 108901A (2019) https://doi.org/10.1117/12.2508109

KEYWORDS: Tissues, Polarimetry, Microscopes, Polarization, Imaging systems, Calibration, Colon, Tissue optics, Objectives, Multispectral imaging

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Proceedings Article | 4 March 2019 Paper

Polarization characteristics of dark-field microscopic polarimetric images of human colon tissue

Toru Fujii, Yasuko Yamasaki, Naooki Saito, Masayasu Sawada, Ryo Narita, Taku Saito, Heather Durko, Photini F. Rice, Gabrielle Hutchens, Joceline Dominguez-Cooks, Harrison Thurgood, Swati Chandra, Valentine Nfonsam, Jennifer Barton

Proceedings Volume 10890, 108902J (2019) https://doi.org/10.1117/12.2509000

KEYWORDS: Tissues, Principal component analysis, Cancer, Polarimetry, Colon, Polarization, Tumors, Microscopes, Tissue optics, Neodymium

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Proceedings Article | 4 March 2010 Paper

Experimental result of polarization characteristics separation method

Toru Fujii, Kosuke Suzuki, Jun Kogo, Kiyoshi Toyama, Kunihisa Sasada, Masayasu Sawada

Proceedings Volume 7640, 76400R (2010) https://doi.org/10.1117/12.846323

KEYWORDS: Polarization, Optical testing, Wavefronts, Lithography, Singular optics, Sensors, Calibration, Projection systems, Jones matrices, Birefringence

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Proceedings Article | 16 March 2009 Paper

True polarization characteristics of hyper-NA optics excluding impact of measurement system

Toru Fujii, Ken-ichi Muramatsu, Noriyuki Matsuo, Yasihiro Ohmura, Masayasu Sawada

Proceedings Volume 7274, 72743K (2009) https://doi.org/10.1117/12.813611

KEYWORDS: Birefringence, Polarization, Optical testing, Projection systems, Crystals, Wavefronts, Lithography, Optical simulations, Matrices, Signal attenuation

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Proceedings Article | 7 March 2008 Paper

Polarization characteristics of state-of-art lithography optics reconstructed from on-body measurement

Toru Fujii, Jun Kogo, Kosuke Suzuki, Masayasu Sawada

Proceedings Volume 6924, 69240Z (2008) https://doi.org/10.1117/12.771812

KEYWORDS: Polarization, Wavefronts, Lithography, Matrices, Optical testing, Projection systems, Phase measurement, Adaptive optics, Fiber optic illuminators, Integrated optics

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Proceedings Article | 27 March 2007 Paper

Polarization properties of state-of-art lithography optics represented by first canonical coordinate of Lie group

Toru Fujii, Yuji Kudo, Yasuhiro Ohmura, Kosuke Suzuki, Jun Kogo, Yasushi Mizuno, Naonori Kita, Masayasu Sawada

Proceedings Volume 6520, 65204W (2007) https://doi.org/10.1117/12.710784

KEYWORDS: Polarization, Matrices, Lithography, Birefringence, Projection systems, Optical lithography, Wavefronts, Crystals, Jones matrices, Signal attenuation

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Proceedings Article | 24 March 2006 Paper

Integrated projecting optics tester for inspection of immersion ArF scanner

Toru Fujii, Kosuke Suzuki, Yasushi Mizuno, Naonori Kita

Proceedings Volume 6152, 615237 (2006) https://doi.org/10.1117/12.656025

KEYWORDS: Polarization, Wavefronts, Scanners, Calibration, Optical testing, Sensors, Wavefront sensors, Charge-coupled devices, Integrated optics, Inspection

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Proceedings Article | 10 May 2005 Paper

On board polarization measuring instrument for high NA excimer scanner

Toru Fujii, Naonori Kita, Yasushi Mizuno

Proceedings Volume 5752, (2005) https://doi.org/10.1117/12.598378

KEYWORDS: Polarization, Polarimetry, Scanners, Fiber optic illuminators, Wave plates, Calibration, Excimers, Light sources, Digital signal processing, Polarization control

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Proceedings Article | 26 June 2003 Paper

Theoretical consideration on quantum lithography with conventional projection

Toru Fujii, Naoki Fukutake, Hisao Osawa, Hiroshi Ooki

Proceedings Volume 5040, (2003) https://doi.org/10.1117/12.485335

KEYWORDS: Lithography, Absorption, Photomasks, Diffraction, Light sources, Interferometry, Interferometers, Crystals, Reticles, Optical lithography

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Proceedings Article | 2 June 2003 Paper

Portable phase measuring interferometer using Shack-Hartmann method

Toru Fujii, Jun Kougo, Yasushi Mizuno, Hiroshi Ooki, Masato Hamatani

Proceedings Volume 5038, (2003) https://doi.org/10.1117/12.482699

KEYWORDS: Wavefronts, Charge-coupled devices, Wavefront sensors, Inspection, Calibration, Phase interferometry, Interferometers, Objectives, Reticles, Semiconducting wafers

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Showing 5 of 10 publications

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