Prof. Toshitaka Wakayama Profile

Prof. Toshitaka Wakayama

at Saitama Medical University

SPIE Involvement:

Conference Program Committee | Author

Publications (33)

Proceedings Article | 8 December 2022 Paper

MCFBG curvature sensor using two-photon absorption process in Si-APD and its application to medical use

Yosuke Tanaka, Toshitaka Wakayama

Proceedings Volume 12480, 124800J (2022) https://doi.org/10.1117/12.2660185

KEYWORDS: Sensors, Fiber optics sensors, Bragg gratings, Signal processing, Fiber Bragg gratings, Absorption, Temperature metrology, Fiber optics, Sensing systems, Optical signal processing

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Proceedings Article | 14 November 2021 Presentation + Paper

Basic study of temperature independent fiber bending sensor for catheters using multicore fiber Bragg grating and two-photon absorption process in Si-APD

Zhao Shihua, Naohiro Sonoda, Reina Takagi, Itsuki Saito, Tetsuya Abe, Toshitaka Wakayama, Yosuke Tanaka

Proceedings Volume 11914, 119140A (2021) https://doi.org/10.1117/12.2603933

KEYWORDS: Temperature metrology, Sensors, Fiber Bragg gratings, Bragg gratings, Fiber optics sensors, Absorption, Signal processing, Modulation, Surgery, Refractive index

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Proceedings Article | 23 August 2021 Paper

Birefringence mapping of optical material by use of supercontinuum vector beams

Juri Ogawa, Misaki Shoji, Ryo Kageyama, Toshitaka Wakayama, Takeshi Higashiguchi

Proceedings Volume 11908, 119080Q (2021) https://doi.org/10.1117/12.2601123

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Proceedings Article | 13 November 2014 Paper

Compact camera for 3D position registration of cancer in radiation treatment

Toshitaka Wakayama, Shun Hiratsuka, Yoshihisa Kamakura, Katsumasa Nakamura, Toru Yoshizawa

Proceedings Volume 9276, 92760G (2014) https://doi.org/10.1117/12.2072170

KEYWORDS: 3D metrology, Cancer, Fringe analysis, Stereoscopic cameras, Cameras, Oncology, Radiotherapy, Semiconductor lasers, Mirrors, Projection systems

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Proceedings Article | 28 May 2014 Paper

Optical center alignment technique based on inner profile measurement method

Toshitaka Wakayama, Toru Yoshizawa

Proceedings Volume 9110, 91100I (2014) https://doi.org/10.1117/12.2050892

KEYWORDS: Optical alignment, Ellipsometry, CCD cameras, Semiconductor lasers, Optics manufacturing, Mirrors, Receivers, Beam shaping, Spindles, Inspection

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SPIE Journal Paper | 9 April 2014 Open Access

High-speed three-dimensional shape measurements using multiwavelength spatiotemporal phase shifting

Toshitaka Wakayama, Toru Yoshizawa

OE, Vol. 53, Issue 11, 112207, (April 2014) https://doi.org/10.1117/12.10.1117/1.OE.53.11.112207

KEYWORDS: 3D metrology, Phase shifts, Fringe analysis, Phase shifting, Projection systems, Semiconductor lasers, Digital Light Processing, Cameras, Mirrors, RGB color model

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Proceedings Article | 27 September 2013 Paper

Evaluation of Mueller matrix of achromatic axially symmetric wave plate

Toshitaka Wakayama, Kazuki Komaki, Israel Vaughn, J. Scott Tyo, Yukitoshi Otani, Toru Yoshizawa

Proceedings Volume 8873, 88730P (2013) https://doi.org/10.1117/12.2023849

KEYWORDS: Wave plates, Polarization, Polarizers, Silica, Polarimetry, Reflection, Polishing, Biomedical optics, Dispersion, Optical components

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Proceedings Article | 6 September 2013 Paper

Uni-axial inner profile measurement

Toshitaka Wakayama, Toru Yoshizawa

Proceedings Volume 8839, 88390L (2013) https://doi.org/10.1117/12.2023473

KEYWORDS: Mirrors, Beam shaping, Charge-coupled devices, CCD cameras, Optical fibers, 3D metrology, Semiconductor lasers, Light sources, Beam splitters, Polarizers

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Proceedings Article | 25 June 2013 Paper

State of the art of compact optical 3D profile measurement apparatuses: from outer surface to inner surface measurement

Toru Yoshizawa, Toshitaka Wakayama

Proceedings Volume 8769, 87691G (2013) https://doi.org/10.1117/12.2021094

KEYWORDS: Mirrors, Microelectromechanical systems, 3D metrology, Cameras, Optical fibers, Semiconductor lasers, CCD cameras, Projection systems, Collimation, Optical testing

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Proceedings Article | 20 November 2012 Paper

Small size probe for inner profile measurement of pipes using optical fiber ring beam device

Toshitaka Wakayama, Kizuku Machi, Toru Yoshizawa

Proceedings Volume 8563, 85630L (2012) https://doi.org/10.1117/12.999878

KEYWORDS: Mirrors, Optical fibers, Charge-coupled devices, Indium nitride, Collimators, Inspection, Ions, Cameras, Optical testing, 3D metrology

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Proceedings Article | 13 September 2012 Paper

An interferometric observation of topological effect by novel axially symmetrical wave plate

Toshitaka Wakayama, Yukitoshi Otani, Toru Yoshizawa

Proceedings Volume 8493, 849306 (2012) https://doi.org/10.1117/12.930456

KEYWORDS: Polarization, Spiral phase plates, Optical vortices, Wave plates, Polarizers, Interferometry, Silica, Polymethylmethacrylate, Optical components, Manufacturing

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SPIE Journal Paper | 31 January 2012

Compact camera for three-dimensional profilometry incorporating a single MEMS mirror

Toshitaka Wakayama, Toru Yoshizawa

OE, Vol. 51, Issue 1, 013601, (January 2012) https://doi.org/10.1117/12.10.1117/1.OE.51.1.013601

KEYWORDS: Mirrors, Microelectromechanical systems, Cameras, Stereoscopic cameras, Semiconductor lasers, Projection systems, LCDs, 3D metrology, CCD cameras, Calibration

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Proceedings Article | 14 September 2011 Paper

Development of a probe for inner profile measurement and flaw detection

Toru Yoshizawa, Toshitaka Wakayama, Yoshihisa Kamakura

Proceedings Volume 8133, 81330D (2011) https://doi.org/10.1117/12.893463

KEYWORDS: Inspection, Mirrors, Cameras, Glasses, Optical components, Defect inspection, Semiconductor lasers, Prisms, Optical testing, CCD cameras

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Proceedings Article | 10 September 2011 Paper

Color pattern projection method for three-dimensional measurement

Toshitaka Wakayama, Toru Yoshizawa

Proceedings Volume 8133, 81330A (2011) https://doi.org/10.1117/12.894183

KEYWORDS: 3D metrology, Microelectromechanical systems, Mirrors, Cameras, Semiconductor lasers, Image sensors, Projection systems, Time metrology, Digital micromirror devices, Stereoscopic cameras

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Proceedings Article | 11 November 2010 Paper

Development of an inner profile measurement instrument using a ring beam device

T. Yoshizawa, T. Wakayama

Proceedings Volume 7855, 78550B (2010) https://doi.org/10.1117/12.870825

KEYWORDS: Mirrors, Cameras, Glasses, Inspection, Semiconductor lasers, Optical components, Medicine, CCD cameras, CMOS cameras, Dentistry

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Inner profile measurement is an important matter in such fields as medicine, dentistry and anthropology as well as mechanical engineering and other industrial applications. Here we describe recent development of our measurement principle for inner diameter of pipes and/or holes. The key device in this technique is a ring beam device which consists of a conical mirror and a laser diode. And the fundamental principle is based on optical sectioning without using any contact type stylus. The optically sectioned profile of an inner wall of a pipe-like object is analyzed to give the inner profile in addition to the inner diameter. This optical instrument with a simple and small configuration is now under development for practical uses. In our hitherto trial experimental works, the availability of this instrument has been evaluated in many cases and availability for practical applications is expected, especially, for measurement and inspection of mechanical components and elements besides pipes. This ring beam device consisting of a conical mirror and a LD is assembled to form a disk-like light sheet. We show measurement result of pipes and holes, and, at the same time, report a compact inner profile measuring instrument at this point. Both the ring beam device and a miniaturized CCD camera are fabricated into a glass tube. Availability of this instrument is shown by measuring the inner profiles of various pipes. In response to this trial, there appeared a strong request that not only the internal but external profiles should be measured simultaneously. Therefore we propose potentially possible method for measurement of external profile at the same time with internal profile. If one pair of concave mirrors are used in our arrangement, external profile is captured. In combination with inner profile measurement technique, simultaneous measurement of inner and outer profiles becomes attainable. A measurement result on a bevel gear shows availability of here proposed principle. In addition, we are trying to extend our technique to check defects and/or flaws on the inner wall of pipe-like objects.

Proceedings Article | 11 November 2010 Paper

Spectroscopic topological Stokes polarimeter

Toshitaka Wakayama, Yukitoshi Otani, Toru Yoshizawa

Proceedings Volume 7855, 785504 (2010) https://doi.org/10.1117/12.871805

KEYWORDS: Polarimetry, Polarization, Spectroscopy, Wave plates, Polarizers, Birefringence, Light sources, Charge-coupled devices, Optical alignment, Spiral phase plates

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Proceedings Article | 11 November 2010 Paper

A palm-top camera for 3D profilometry incorporating a MEMS scanner

T. Yoshizawa, T. Wakayama

Proceedings Volume 7855, 78550D (2010) https://doi.org/10.1117/12.870827

KEYWORDS: Cameras, Microelectromechanical systems, 3D metrology, 3D scanning, Semiconductor lasers, Laser scanners, Stereoscopic cameras, Image sensors, Scanners, Mirrors

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Proceedings Article | 24 November 2009 Paper

Measurement of inner and/or outer profiles of pipes using ring beam devices

T. Wakayama, T. Yoshizawa

Proceedings Volume 7513, 751306 (2009) https://doi.org/10.1117/12.838194

KEYWORDS: Mirrors, Cameras, Glasses, Inspection, Optical components, Semiconductor lasers, CMOS cameras, Refractive index, Medicine, Dentistry

Read Abstract +

Inner profile measurement is an important matter in such fields as medicine, dentistry and anthropology as well as mechanical engineering and industry. Here we propose a measurement method for inner diameter of pipes and/or holes. The key device in this technique is a ring beam device which consists of a conical mirror and a laser diode. And the fundamental principle is based on optical sectioning without any contact probe. The optically sectioned profile of an inner wall of a pipe-like object is analyzed to give the inner profile in addition to the inner diameter. This optical instrument with a simple and small configuration is now under development for practical uses. In the hitherto-tried experimental works, the availability of this instrument has been highly evaluated and usability for practical applications is expected, especially, for measurement and inspection of mechanical components and elements besides pipes. This ring beam device consisting of a conical mirror and a LD is assembled to form a disklike light beam sheet. We show measurement result of pipes and holes, and, at the same time, report a compact inner profile measuring instrument. Both the ring beam device and a miniaturized CCD camera are fabricated in a glass tube. Availability of this instrument is shown by measuring the inner profiles of various pipes. In response to this trial, there appeared a strong request that not only the internal but external profiles should be measured simultaneously. Therefore we propose an improved method for measuring the external profile in addition to the internal profile. In our arrangement, one pair of concaved conical mirrors is used for the external profile measurement. In combination with the inner profile measurement technique, simultaneous measurement of the inner and outer profiles becomes attainable. A measurement result on a bevel gear shows availability of newly proposed principle. Now we are aiming to realize simultaneous measurement of the internal and external profiles of various types of pipes and similar objects.

Proceedings Article | 10 September 2009 Paper

Three-dimensional profilometry system incorporating a MEMS scanner

Toru Yoshizawa, Toshitaka Wakayama

Proceedings Volume 7432, 74320P (2009) https://doi.org/10.1117/12.825980

KEYWORDS: Microelectromechanical systems, Mirrors, 3D scanning, 3D metrology, Projection systems, Laser scanners, Scanners, Imaging systems, Stereoscopic cameras, Cameras

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Proceedings Article | 12 August 2009 Paper

Axisymmetrical Mueller matrix polarimeter

Toshitaka Wakayama, Yukitoshi Otani, Toru Yoshizawa

Proceedings Volume 7461, 74610M (2009) https://doi.org/10.1117/12.826678

KEYWORDS: Polarimetry, Sensors, Polarization, Modulation, Polarizers, Wave plates, CCD image sensors, CCD cameras, Mirrors, Axicons

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Proceedings Article | 17 November 2008 Paper

Generation of vortex spectra based on geometric phase for optical tweezers

Toshitaka Wakayama, Yukitoshi Otani, Toru Yoshizawa

Proceedings Volume 7266, 72660A (2008) https://doi.org/10.1117/12.817387

KEYWORDS: Optical tweezers, Spatial light modulators, Polarizers, Polarization, Wave plates, Spiral phase plates, Geometrical optics, Particles, Dielectric polarization, Light sources

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Proceedings Article | 29 August 2008 Paper

Simultaneous measurement of internal and external profiles using a ring beam device

Toshitaka Wakayama, Toru Yoshizawa

Proceedings Volume 7066, 70660D (2008) https://doi.org/10.1117/12.794388

KEYWORDS: Mirrors, Cameras, 3D metrology, Inspection, Beam shaping, Glasses, Semiconductor lasers, CCD cameras, Precision measurement, Optical testing

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Proceedings Article | 10 October 2007 Paper

Applications of a MEMS scanner to profile measurement

Toru Yoshizawa, Toshitaka Wakayama, Hiroshi Takano

Proceedings Volume 6762, 67620B (2007) https://doi.org/10.1117/12.733048

KEYWORDS: Microelectromechanical systems, Mirrors, Scanners, 3D scanning, 3D metrology, Binary data, Phase shifts, Laser scanners, Fringe analysis, Manufacturing

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Proceedings Article | 10 October 2007 Paper

Development of a compact inner profile measuring instrument

T. Wakayama, H. Takano, T. Yoshizawa

Proceedings Volume 6762, 67620D (2007) https://doi.org/10.1117/12.733215

KEYWORDS: Cameras, Glasses, Mirrors, Inspection, Optical components, Semiconductor lasers, Refractive index, Calibration, Error analysis, CMOS sensors

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Proceedings Article | 12 October 2006 Paper

White light displacement sensor by spectro-polarization modulator

Yukitoshi Otani, Toshitaka Wakayama, Dmitry Orlov, Norihiro Umeda, Toru Yoshizawa

Proceedings Volume 6382, 638205 (2006) https://doi.org/10.1117/12.689279

KEYWORDS: Polarization, Modulators, Sensors, Spectroscopy, Optical sensors, Wave plates, Polarizers, Chromatic aberrations, Spectroscopes, Light sources

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Proceedings Article | 12 October 2006 Paper

Inner profile measurement of pipes and holes using a ring beam device

Toru Yoshizawa, Masayuki Yamamoto, Toshitaka Wakayama

Proceedings Volume 6382, 63820D (2006) https://doi.org/10.1117/12.689317

KEYWORDS: Mirrors, Inspection, CCD cameras, Cameras, Prisms, Optical fabrication equipment, Polishing, Optical testing, Charge-coupled devices, Liquids

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Proceedings Article | 14 August 2006 Paper

Displacement measurement by spectro-polarization modulator

Yukitoshi Otani, Toshitaka Wakayama, Dmitry Orlov, Norihiro Umeda

Proceedings Volume 6292, 629213 (2006) https://doi.org/10.1117/12.682472

KEYWORDS: Modulators, Wave plates, Polarizers, Polarization, Spectroscopy, Colorimetry, Light sources, Mirrors, CCD cameras, Chromatic aberrations

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SPIE Journal Paper | 1 August 2006

Birefringence dispersion measurement based on achromatic four points of geometric phase

Toshitaka Wakayama, Yukitoshi Otani, Norihiro Umeda

OE, Vol. 45, Issue 08, 083603, (August 2006) https://doi.org/10.1117/12.10.1117/1.2336229

KEYWORDS: Birefringence, Polarization, Poincaré sphere, Error analysis, Spectroscopy, Light sources, Phase shifting, Polarizers, Crystal optics, Optical engineering

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SPIE Journal Paper | 1 March 2006

Two-dimensional measurement of birefringence dispersion using spectroscopic polarized light

Toshitaka Wakayama, Hiroyuki Kowa, Yukitoshi Otani, Norihiro Umeda, Toru Yoshizawa

OE, Vol. 45, Issue 03, 033601, (March 2006) https://doi.org/10.1117/12.10.1117/1.2179787

KEYWORDS: Birefringence, Spectroscopy, Polarizers, Quartz, Modulation, Optical engineering, Wave plates, CCD cameras, Acousto-optics, Tunable filters

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Proceedings Article | 18 August 2005 Paper

Real-time measurement for birefringence dispersion using double retarder

Toshitaka Wakayama, Yukitoshi Otani, Norihiro Umeda

Proceedings Volume 5888, 588807 (2005) https://doi.org/10.1117/12.618065

KEYWORDS: Birefringence, Spectroscopy, Wave plates, Modulation, Amplifiers, Polarizers, Light sources, Fourier transforms, Light, Manufacturing

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Proceedings Article | 18 October 2002 Paper

Birefringence dispersion measurement by geometric phase

Toshitaka Wakayama, Hiroyuki Kowa, Yukitoshi Otani, Norihiro Umeda, Toru Yoshizawa

Proceedings Volume 4902, (2002) https://doi.org/10.1117/12.467709

KEYWORDS: Birefringence, Phase measurement, Polarization, Poincaré sphere, Wave plates, Spectroscopy, Polarizers, Phase shifting, Modulators, LCDs

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Proceedings Article | 20 September 2002 Paper

Two-dimensional measurement of birefringence disperion using spectroscopic polarized light

Toshitaka Wakayama, Hiroyuki Kowa, Yukitoshi Otani, Norihiro Umeda, Toru Yoshizawa

Proceedings Volume 4919, (2002) https://doi.org/10.1117/12.465724

KEYWORDS: Birefringence, Spectroscopy, Modulation, Quartz, Polarizers, Polymers, Phase shift keying, Polymer thin films, Light sources, Light

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Proceedings Article | 8 May 2001 Paper

High-order birefringence and dispersion measurement using spectroscopy of polarized light

Toshitaka Wakayama, Hiroyuki Kowa, Yukitoshi Otani, Norihiro Umeda, Toru Yoshizawa

Proceedings Volume 4416, (2001) https://doi.org/10.1117/12.427032

KEYWORDS: Birefringence, Spectroscopy, Polymers, Spectroscopes, Modulation, Polarizers, Polymer thin films, Light sources, Light, CCD cameras

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Showing 5 of 33 publications

Conference Committee Involvement (16)

Optical Technology and Measurement for Industrial Applications Conference

21 April 2025 | Yokohama, Japan

Optical Metrology and Inspection for Industrial Applications XI

12 October 2024 | Nantong, Jiangsu, China

Optical Technology and Measurement for Industrial Applications Conference

22 April 2024 | Yokohama, Japan

Optical Metrology and Inspection for Industrial Applications X

15 October 2023 | Beijing, China

Optical Technology and Measurement for Industrial Applications Conference

17 April 2023 | Yokohama, Japan

Optical Metrology and Inspection for Industrial Applications IX

5 December 2022 | Online Only, China

Optical Technology and Measurement for Industrial Applications Conference 2022

18 April 2022 | Yokohama, Japan

Optical Metrology and Inspection for Industrial Applications VIII

11 October 2021 | Nantong, JS, China

Optical Technology and Measurement for Industrial Applications Conference

20 April 2021 | Online, Japan

Optical Metrology and Inspection for Industrial Applications VII

12 October 2020 | Online Only, China

Optical Technology and Measurement for Industrial Applications Conference

22 April 2020 | Yokohama, Japan

Optical Metrology and Inspection for Industrial Applications VI

21 October 2019 | Hangzhou, China

Optical Technology and Measurement for Industrial Applications Conference

23 April 2019 | Yokohama, Japan

Optical Metrology and Inspection for Industrial Applications V

11 October 2018 | Beijing, China

Optical Metrology and Inspection for Industrial Applications IV

12 October 2016 | Beijing, China

Optical Metrology and Inspection for Industrial Applications III

9 October 2014 | Beijing, China

Showing 5 of 16 Conference Committees

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