Prof. Volodymyr Zaslavskyi
at Taras Shevchenko National Univ of Kyiv
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 20 April 2017 Paper
Proceedings Volume 10418, 1041803 (2017) https://doi.org/10.1117/12.2270421
KEYWORDS: Tolerancing, Reliability, Safety, Defect detection, Information security, Mathematical modeling, Control systems, Chemical elements, Optimization (mathematics), Systems modeling

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