Won-Jae Jang
at ASML Korea Co Ltd
SPIE Involvement:
Author
Publications (5)

Proceedings Article | 20 March 2020 Presentation + Paper
Proceedings Volume 11325, 113251J (2020) https://doi.org/10.1117/12.2551676
KEYWORDS: Overlay metrology, Semiconducting wafers, Calibration, Metrology, Diffraction gratings, Polarization, Optical testing, Etching, Electronics, Optical lithography

Proceedings Article | 26 March 2019 Paper
Jang-Sun Kim, Jin-Moo Byun, Remco Lancee, Jong-Hyun Hwang, Hyeon-Jun Ha, Kwang-Young Hu, Se-Ra Jeon, Won-Jae Jang, Hyung-Sub Son, Vidar van der Meijden, Marc Noot, Bartosz Foltynski, Lukasz Macht, Grzegorz Grzela, Cedric Grouwstra
Proceedings Volume 10959, 109592M (2019) https://doi.org/10.1117/12.2514931
KEYWORDS: Overlay metrology, Metrology, Front end of line, Yield improvement, Control systems, Scatterometry

Proceedings Article | 16 February 2017 Presentation + Paper
Proceedings Volume 10106, 101061A (2017) https://doi.org/10.1117/12.2251686
KEYWORDS: Refractive index, Surface plasmons, Sensors, Liquid lenses, Liquids, Metals, Waveguides, Dielectrics, Interfaces, Modulation

Proceedings Article | 22 April 2016 Presentation + Paper
Proceedings Volume 9721, 97210O (2016) https://doi.org/10.1117/12.2212009
KEYWORDS: Surface plasmons, Nanostructures, Sensors, Transmittance, Chemical analysis, Metals, Biosensing, Refractive index, Glucose, Light sources

Proceedings Article | 14 March 2016 Paper
Proceedings Volume 9759, 97591F (2016) https://doi.org/10.1117/12.2212023
KEYWORDS: Photoresist materials, Optical lithography, Coating, Glasses, Oxygen, Plasma, Photoresist developing, Manufacturing, Metals, Photomasks, Lithography, Microlens array

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