Prof. Xavier Aymerich Profile

Prof. Xavier Aymerich

Professor at Univ Autonoma de Barcelona

SPIE Involvement:

Author

Publications (5)

Proceedings Article | 30 June 2005 Paper

Paper

Ring oscillator behavior after oxide breakdown

R. Fernandez, R. Rodriguez, M. Nafria, X. Aymerich

Proceedings Volume 5837, (2005) https://doi.org/10.1117/12.608245

KEYWORDS: Oxides, Oscillators, Transistors, Field effect transistors, Device simulation, Measurement devices, Reliability, Instrument modeling, Systems modeling, Dielectric breakdown

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Proceedings Article | 28 June 2005 Paper

Paper

Charge storage in Si nanocrystals embedded in SiO2 with enhanced C-AFM

M. Porti, M. Avidano, M. Nafria, X. Aymerich, J. Carreras, B. Garrido

Proceedings Volume 5838, (2005) https://doi.org/10.1117/12.608206

KEYWORDS: Oxides, Silicon, Molybdenum, Electrons, Nanocrystals, Transmission electron microscopy, Electrodes, Atomic force microscopy, Ions, Computer programming

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Proceedings Article | 29 April 2003 Paper

Paper

MOS-based nanocapacitor using C-AFM

Daniel Hill, Sascha Sadewasser, Xavier Aymerich

Proceedings Volume 5118, (2003) https://doi.org/10.1117/12.498556

KEYWORDS: Titanium, Atomic force microscopy, Oxides, Etching, Molybdenum, Aluminum, Silica, Dielectrics, Oxidation, Titanium dioxide

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Proceedings Article | 29 April 2003 Paper

Paper

Nanometer-scale analysis of current limited stresses impact on SiO2 gate oxide reliability using C-AFM

Marc Porti, Montserrat Nafria, Xavier Aymerich

Proceedings Volume 5118, (2003) https://doi.org/10.1117/12.498778

KEYWORDS: Oxides, Reliability, Molybdenum, Metals, Electrodes, Silicon, Atomic force microscope, Transistors, Electrons, Electroluminescence

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Proceedings Article | 29 April 2003 Paper

Paper

Electrical characterization of atomic-force-microscopy grown SiO2

Xavier Blasco, Montserrat Nafria, Xavier Aymerich

Proceedings Volume 5118, (2003) https://doi.org/10.1117/12.498901

KEYWORDS: Atomic force microscopy, Oxides, Molybdenum, Silicon, Dielectrics, Capacitors, Silica, Semiconducting wafers, Microelectronics, Oxidation

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Proceedings Volume Editor (1)

SPIE Conference Volume | 29 April 2003

Nanotechnology

Conference Committee Involvement (2)

Nanotechnology II

9 May 2005 | Sevilla, Spain

Nanotechnology

19 May 2003 | Maspalomas, Gran Canaria, Canary Islands, Spain

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