Dr. Xiao Li
Sr Process Engineer at Broadcom Inc
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 29 March 2006 Paper
Xiao Li, Tom Lehmann, Warren Greene
Proceedings Volume 6153, 61533A (2006) https://doi.org/10.1117/12.655360
KEYWORDS: Coating, Photoresist processing, Semiconducting wafers, Metals, Etching, Thin film coatings, Critical dimension metrology, Silicon, Manufacturing, Semiconductors

Proceedings Article | 4 May 2005 Paper
Xiao Li, Tom Lehmann, Warren Greene
Proceedings Volume 5753, (2005) https://doi.org/10.1117/12.598471
KEYWORDS: Coating, Photoresist processing, Semiconducting wafers, Lithium, Semiconductors, Manufacturing, Photoresist materials, Critical dimension metrology, Process engineering, Thin film coatings

Proceedings Article | 14 May 2004 Paper
Xiao Li, Warren Greene, Chris Bowker
Proceedings Volume 5376, (2004) https://doi.org/10.1117/12.534150
KEYWORDS: Coating, Semiconducting wafers, Photoresist processing, Deep ultraviolet, Critical dimension metrology, Bottom antireflective coatings, Semiconductors, Manufacturing, Silicon, Etching

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