Yunje Cho
at SAMSUNG Electronics Co., Ltd.
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 13 June 2022 Presentation
Proceedings Volume PC12053, PC120530B (2022) https://doi.org/10.1117/12.2612446
KEYWORDS: Scanning electron microscopy, Deconvolution, Monochromatic aberrations, Image processing, Resolution enhancement technologies, Mathematics, Image resolution, Image quality, Image enhancement, Distortion

Proceedings Article | 8 March 2021 Presentation + Paper
Proceedings Volume 11611, 116110G (2021) https://doi.org/10.1117/12.2582269
KEYWORDS: Reflectometry, Super resolution, Reflectance spectroscopy, Semiconductors, Metrology, Photonic nanostructures, Spectroscopes, Signal to noise ratio, Semiconducting wafers, Image resolution

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