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Yan Li
at Shenzhen Univ
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Publications (1)
Proceedings Article | 16 December 2013 Paper
Dependence of annealing temperature on microstructure and photoelectrical properties of vanadium oxide thin films prepared by DC reactive sputtering
Yan Li, Dongping Zhang, Bo Wang, Guangxing Liang, Zhuanghao Zheng, Jingting Luo, Xingmin Cai, Ping Fan
Proceedings Volume 9068, 906803 (2013) https://doi.org/10.1117/12.2054097
KEYWORDS: Annealing, Vanadium, Oxides, Thin films, Sputter deposition, Transmittance, Crystals, Diffraction, Semiconductors, Resistance
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