The segmented planar imaging method is a new imaging concept based on Van Cittert-Zernike theory that offers significantly reduced size, weight, and power consumption replacing traditional refracting/reflecting telescopes with photonic integrated circuits (PICs). As one of the key components, the phase shifter plays a role in compensating for phase, and its phase shift accuracy has an important impact on the imaging quality of segmented planar imaging detectors. In this paper, a degradation model of the accuracy of phase shifters on the degradation of imaging quality is established and the impact of phase shifter accuracy on system imaging quality is analyzed. The tolerance error of phase shifter phase shift accuracy was determined γ≤10% by analyzing the imaging results of spectral channels corresponding to different paired baselines under the same phase shifter phase shift accuracy. The analysis conclusion provides a theoretical basis for the manufacturing of segmented planar imaging detector.
Segmented interference array integrated optical imaging technology is an important branch in the development of advanced optical remote sensing imaging detection technology. Aiming at the problem of insufficient zero-frequency frequency in the existing segmented interference array integrated optical imaging system, this paper proposes a new design combining traditional lens and microlens array. By filling a single lens in the center of the wheel-type lens array to increase the number of zero-frequency and low-frequency information sampling points thereby effectively improving the imaging quality. The research results will provide a new idea for the optimal design of the segmented interference array integrated optical imaging system.
The segmented planar imaging method is a new imaging concept based on Van Cittert-Zernike theory that offers significantly reduced size, weight, and power consumption compared to a traditional imaging system and aims to realize high resolution imaging. In this paper, the segmented planar imaging detector (SPID) imaging process has been accurately modeled and quantitatively analyzed to image quality enhancement. The influences of the longest interferometer baseline and the spectral channel number of array wave-guide grating(AWG) on the imaging quality of the SPID have been analyzed. It is verified that the cut off spatial frequency and the resolution of the SPID system is determined by the longest interferometer baseline Bmax. The imaging process of different Bmax have been numerical simulated to evaluate the impact of longest interferometer baseline on the SPID system, and the reconstruction image shows that the imaging quality can be improved by increasing the longest interferometer baseline. Also, the numerical simulations of different number of spectral channels of AWG have been operated, and the results showed that the visibility of interference fringes and spatial frequency coverage points are increased with the increasing number of spectral channels. Therefore, the imaging quality improved with the increasing number of spectral channel of AWG. In conclusions, the research results will provide theoretical and technical supports for segmented planar integral optical imaging system development.
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