Speckle patterns are sensitive to wavelength variations, and can be used to measure such variations. Recently, a new way of producing speckles have been introduced, using an integrating sphere. Here, we derive a general model predicting the change occurring in a speckle pattern as a result of a generic transformation in this particular geometry. Applying this model to a wavelength variation, we show that the speckle sensitivity is mainly governed by two parameters: the radius and surface reflectivity of the sphere. We show analytically and experimentally that integrating spheres offer sensitivity four orders of magnitude above that of commonly-used multimode optical fibres offering excellent prospects for speckle metrology.
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