Radar And Optical Edge Measurements

Robert Y. Wong

doi:10.1117/12.959177

23 December 1980 Radar And Optical Edge Measurements

Robert Y. Wong

Proceedings Volume 0238, Image Processing for Missile Guidance; (1980) https://doi.org/10.1117/12.959177
Event: 24th Annual Technical Symposium, 1980, San Diego, United States

Abstract

Several pattern recognition methods have been used in scene matching. These methods include the use of intensity difference, edge measurements, invariant moments and symbolic descriptions as measurement features. This paper describes a method used in extracting edge measurements from radar and optical images for the purpose of scene matching.

Citation Download Citation

Robert Y. Wong "Radar And Optical Edge Measurements", Proc. SPIE 0238, Image Processing for Missile Guidance, (23 December 1980); https://doi.org/10.1117/12.959177

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