Paper
26 October 1983 Automated Digital Analysis Of Holographic Interferograms Of Pure Translations
A. Choudry, H. J. Frankena, J. W. van Beek
Author Affiliations +
Proceedings Volume 0398, Industrial Applications of Laser Technology; (1983) https://doi.org/10.1117/12.935356
Event: 1983 International Technical Conference/Europe, 1983, Geneva, Switzerland
Abstract
Holographic interferometry is a versatile technique for non-tactile measurement of changes in a wide variety of physical variables such as temperature, strain, position etc. It has a great potential for becoming an important metrologic technique in industrial applications. For holographic interferometry to become more attractive for industrial practice the problem of quantitative analysis of the patterns and thereby eliciting reliable values of the relevant parameters has to be addressed. In an attempt to calibrate the technique of holographic interferometry and ascertain the reliability of the subsequent digital analysis, we have chosen precisely known translations as a basis. Holographic interferograms taken from these are analysed manually and by digital techniques specially developed for such patterns. The results are promising enough to indicate the feasibility of automated digital analysis for determining translations within an acceptable accuracy. Some details of the evaluation techniques, along with a brief discussion of the preliminary results are presented.
© (1983) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
A. Choudry, H. J. Frankena, and J. W. van Beek "Automated Digital Analysis Of Holographic Interferograms Of Pure Translations", Proc. SPIE 0398, Industrial Applications of Laser Technology, (26 October 1983); https://doi.org/10.1117/12.935356
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Calibration

Digital holography

Holography

Photography

Holographic interferometry

Image processing

Fringe analysis

Back to Top