Experimental Device for X-UV Gain Measurement Using Interferential Mirror, Fast Time Resolved Detection and On-Line Data Processing

A. Carillon; G. Jamelot; A. Klisnick; G. Tevanian; P. Jaegle; P. Dhez

doi:10.1117/12.964815

9 April 1987 Experimental Device for X-UV Gain Measurement Using Interferential Mirror, Fast Time Resolved Detection and On-Line Data Processing

A. Carillon, G. Jamelot, A. Klisnick, G. Tevanian, P. Jaegle, P. Dhez

Author Affiliations +

Proceedings Volume 0688, Multilayer Structures & Laboratory X-Ray Laser Research; (1987) https://doi.org/10.1117/12.964815
Event: 30th Annual Technical Symposium, 1986, San Diego, United States

Abstract

Attempts have been made for using a multilayer interferential mirror in normal incidence to enhance X-UV Amplification of Spontaneous Emission (A.S.E) from an aluminum plasma column in the range of 100 A. Two series of experiments have been performed successively, one dealing with time integrated, the other with time resolved measurements using on line detectors for both series. Detailed description is made of experimental set-ups and a discussion is presented about further improvement.

Citation Download Citation

A. Carillon, G. Jamelot, A. Klisnick, G. Tevanian, P. Jaegle, and P. Dhez "Experimental Device for X-UV Gain Measurement Using Interferential Mirror, Fast Time Resolved Detection and On-Line Data Processing", Proc. SPIE 0688, Multilayer Structures & Laboratory X-Ray Laser Research, (9 April 1987); https://doi.org/10.1117/12.964815

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