Study of Multilayered X-UV Polarizers and Consequence of the Use of Partially Polarized Light on Absolute Reflectivity Measurements

A. Khandar; P. Dhez; M. Berland

doi:10.1117/12.964841

9 April 1987 Study of Multilayered X-UV Polarizers and Consequence of the Use of Partially Polarized Light on Absolute Reflectivity Measurements

A. Khandar, P. Dhez, M. Berland

Author Affiliations +

Proceedings Volume 0688, Multilayer Structures & Laboratory X-Ray Laser Research; (1987) https://doi.org/10.1117/12.964841
Event: 30th Annual Technical Symposium, 1986, San Diego, United States

Abstract

An X-UV polarimeter with a rotating 45° angle of incidence multilayer as polarizer has been built and used to measure the polarization rates of the 154A and 304A light after monochromators. Due to the good polarization of the synchrotron source, polarization rates around of 70% have been measured.

Citation Download Citation

A. Khandar, P. Dhez, and M. Berland "Study of Multilayered X-UV Polarizers and Consequence of the Use of Partially Polarized Light on Absolute Reflectivity Measurements", Proc. SPIE 0688, Multilayer Structures & Laboratory X-Ray Laser Research, (9 April 1987); https://doi.org/10.1117/12.964841

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