High Accuracy Emittance Measurement By Newly Designed Portable Device

M. Sando; A. Fujii; S. Tanemura; T. Noguchi

doi:10.1117/12.936696

23 February 1987 High Accuracy Emittance Measurement By Newly Designed Portable Device

M. Sando, A. Fujii, S. Tanemura, T. Noguchi

Proceedings Volume 0692, Materials and Optics for Solar Energy Conversion and Advanced Lightning Technology; (1987) https://doi.org/10.1117/12.936696
Event: 30th Annual Technical Symposium, 1986, San Diego, United States

Abstract

An emittance meter which utilizes internal standards by Au plated mirror and low temperature blackbody furnace as low and high emittance standards respectively has been developed. The obtained emittance value of which systematic error was compensated had accuracy within ±0.01 and precision within ±0.003. The long term drift of measured emittance value was also checked and confirmed to be within ±0.01 for one year continuous operation.

Citation Download Citation

M. Sando, A. Fujii, S. Tanemura, and T. Noguchi "High Accuracy Emittance Measurement By Newly Designed Portable Device", Proc. SPIE 0692, Materials and Optics for Solar Energy Conversion and Advanced Lightning Technology, (23 February 1987); https://doi.org/10.1117/12.936696

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