X-Ray Measurements For The Determination Of Extension And Divergence Of Electron Beams In Storage Rings

F. Riehle; E. Tegeler; B. Wende

doi:10.1117/12.964895

1 January 1986 X-Ray Measurements For The Determination Of Extension And Divergence Of Electron Beams In Storage Rings

F. Riehle, E. Tegeler, B. Wende

Proceedings Volume 0733, Soft X-Ray Optics and Technology; (1986) https://doi.org/10.1117/12.964895
Event: Soft X-Ray Optics and Technology, 1987, Berlin, Germany

Abstract

Methods are presented for the determination of the vertical extension and divergence of electron beams in storage rings which also allow to obtain the vertical emittance. The ver-tical extension of the electron beam of the storage ring BESSY was measured with an X-ray slit camera. The vertical divergence was derived from the vertical angular distribution of the synchrotron radiation of the storage ring measured with either an X-ray polarimeter or an energy dispersive X-ray photon counter.

Citation Download Citation

F. Riehle, E. Tegeler, and B. Wende "X-Ray Measurements For The Determination Of Extension And Divergence Of Electron Beams In Storage Rings", Proc. SPIE 0733, Soft X-Ray Optics and Technology, (1 January 1986); https://doi.org/10.1117/12.964895

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available