Presentation + Paper
13 March 2017 Implementation of material decomposition using an EMCCD and CMOS-based micro-CT system
Author Affiliations +
Abstract
This project assessed the effectiveness of using two different detectors to obtain dual-energy (DE) micro-CT data for the carrying out of material decomposition. A micro-CT coupled to either a complementary metal-oxide semiconductor (CMOS) or an electron multiplying CCD (EMCCD) detector was used to acquire image data of a 3D-printed phantom with channels filled with different materials. At any instance, materials such as iohexol contrast agent, water, and platinum were selected to make up the scanned object. DE micro-CT data was acquired, and slices of the scanned object were differentiated by material makeup. The success of the decomposition was assessed quantitatively through the computation of percentage normalized root-mean-square error (%NRMSE). Our results indicate a successful decomposition of iohexol for both detectors (%NRMSE values of 1.8 for EMCCD, 2.4 for CMOS), as well as platinum (%NRMSE value of 4.7). The CMOS detector performed material decomposition on air and water on average with 7 times more %NRMSE, possibly due to the decreased sensitivity of the CMOS system. Material decomposition showed the potential to differentiate between materials such as the iohexol and platinum, perhaps opening the door for its use in the neurovascular anatomical region. Work supported by Toshiba America Medical Systems, and partially supported by NIH grant 2R01EB002873.
Conference Presentation
© (2017) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Alexander R. Podgorsak, S.V. Setlur Nagesh, Daniel R. Bednarek, Stephen Rudin, and Ciprian N. Ionita "Implementation of material decomposition using an EMCCD and CMOS-based micro-CT system", Proc. SPIE 10137, Medical Imaging 2017: Biomedical Applications in Molecular, Structural, and Functional Imaging, 1013714 (13 March 2017); https://doi.org/10.1117/12.2253892
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CITATIONS
Cited by 1 scholarly publication.
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KEYWORDS
Sensors

CMOS sensors

Electron multiplying charge coupled devices

Platinum

Calibration

Data acquisition

Image processing

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