Measurement of material thickness in the presence of a protective film

Rajesh Ramamurthy; Kevin Harding

doi:10.1117/12.2264569

1 May 2017 Measurement of material thickness in the presence of a protective film

Rajesh Ramamurthy, Kevin Harding

Proceedings Volume 10220, Dimensional Optical Metrology and Inspection for Practical Applications VI; 102200J (2017) https://doi.org/10.1117/12.2264569
Event: SPIE Commercial + Scientific Sensing and Imaging, 2017, Anaheim, CA, United States

Abstract

Many sheet products from plastic to structural composites are produce in tightly controlled thickness needed for functional applications. There are many methods that have been used to measure such sheeting from mechanical rollers to optical micrometers. However, many materials are produced with a thin protective film on either side that may not have critical dimensional controls. This paper addresses the challenge of measuring sheet products to critical thickness values in the presence of protective plastic films using high speed optical gaging methods. For this application, the protective films are assumed to be transparent though not necessarily scatter free, and have thickness variations that are comparable to the tolerances of the sheet product. We will examine the pros and cons of a number of different optical measurement methods in light of resolution, speed and robustness to the film thickness variation and present an approach able to address the desired sheet measurement tolerances.

Conference Presentation

Citation Download Citation

Rajesh Ramamurthy and Kevin Harding "Measurement of material thickness in the presence of a protective film", Proc. SPIE 10220, Dimensional Optical Metrology and Inspection for Practical Applications VI, 102200J (1 May 2017); https://doi.org/10.1117/12.2264569

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