Paper
2 March 1989 Parallel Processing Of Attributes Of Digital Lines
Jurgen Saedler
Author Affiliations +
Proceedings Volume 1027, Image Processing II; (1989) https://doi.org/10.1117/12.950260
Event: 1988 International Congress on Optical Science and Engineering, 1988, Hamburg, Germany
Abstract
A simple but efficient method for the parallel processing of line features is developed. Only a 3*3-window multiple scans the image. The usual content-and position-dependent line tracking is replaced by independent local operations. Recursive functions are written and explained for the addition of line features, the evaluation of chord vectors, the dorivinc of difference chain codes and the estimation of the curvature. Direction elements and operations and essential digital features are defined.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jurgen Saedler "Parallel Processing Of Attributes Of Digital Lines", Proc. SPIE 1027, Image Processing II, (2 March 1989); https://doi.org/10.1117/12.950260
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KEYWORDS
Image processing

Image segmentation

Raster graphics

Chemical elements

Parallel processing

Algorithm development

Parallel computing

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