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The papers in this volume were part of the technical conference cited on the cover and title page. Papers were selected and subject to review by the editors and conference program committee. Some conference presentations may not be available for publication. Additional papers and presentation recordings may be available online in the SPIE Digital Library at SPIEDigitalLibrary.org. The papers reflect the work and thoughts of the authors and are published herein as submitted. The publisher is not responsible for the validity of the information or for any outcomes resulting from reliance thereon. Please use the following format to cite material from these proceedings: Author(s), “Title of Paper,” in Reliability of Photovoltaic Cells, Modules, Components, and Systems X, edited by Neelkanth G. Dhere, Keiichiro Sakurai, Michael D. Kempe, Proceedings of SPIE Vol. 10370 (SPIE, Bellingham, WA, 2017) Seven-digit Article CID Number. ISSN: 0277-786X ISSN: 1996-756X (electronic) ISBN: 9781510611979 ISBN: 9781510611986 (electronic) Published by SPIE P.O. Box 10, Bellingham, Washington 98227-0010 USA Telephone +1 360 676 3290 (Pacific Time)· Fax +1 360 647 1445 Copyright © 2017, Society of Photo-Optical Instrumentation Engineers. Copying of material in this book for internal or personal use, or for the internal or personal use of specific clients, beyond the fair use provisions granted by the U.S. Copyright Law is authorized by SPIE subject to payment of copying fees. The Transactional Reporting Service base fee for this volume is $18.00 per article (or portion thereof), which should be paid directly to the Copyright Clearance Center (CCC), 222 Rosewood Drive, Danvers, MA 01923. Payment may also be made electronically through CCC Online at copyright.com. Other copying for republication, resale, advertising or promotion, or any form of systematic or multiple reproduction of any material in this book is prohibited except with permission in writing from the publisher. The CCC fee code is 0277-786X/17/$18.00. Printed in the United States of America. Publication of record for individual papers is online in the SPIE Digital Library.
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AuthorsNumbers in the index correspond to the last two digits of the seven-digit citation identifier (CID) article numbering system used in Proceedings of SPIE. The first five digits reflect the volume number. Base 36 numbering is employed for the last two digits and indicates the order of articles within the volume. Numbers start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B…0Z, followed by 10-1Z, 20-2Z, etc. Agha, Haider, 08 Ali, Saddam, 08 Anand, H., 0A Barreau, N., 09 Bemm, Andreas, 0H Bennett, Whit E., 0G Beyeler, K., 09 Bora, Birinchi, 0D Boyce, Kenneth P., 03, 0L Brabec, Christoph J., 0B, 0H Bruckman, Laura S., 03, 04, 05, 0L Buerhop, Claudia, 0B, 0H Burns, David M., 05 Camus, Christian, 0B, 0H Curtis, Telia, 08 De Amorim Soares, G., 09 DeNoyer, Lin, 05 Dhere, Neelkanth G., 0I Elwood, Teri, 06 Fairbrother, Andrew, 03, 0L Fecher, Frank W., 0B Felder, Thomas C., 02 Fishgold, Asher D., 0G French, Roger H., 03, 04, 05, 0L Fridman, Lucas S., 0L Gambogi, William J., 02 Gillner, A., 0A Gok, Abdulkerim, 04 Gordon, Devin A., 05 Gu, Xiaohong, 03, 0L Hauch, Jens, 0B, 0H Hördemann, C., 0A Ifeanyi, Silas I., 04 Ji, Liang, 03, 0L Julien, Scott, 03, 0L Kempe, Michael, 03, 0L Klinke, Addison G., 04 Kumar, Rajesh, 0D Lai, Teh, 0G, 0J, 0K Lefebvre, Amy L., 03, 0L Loyer, Camille, 0L MacMaster, Steven W., 02 Mahmood, Farrukh, 08 Majeed, Hatif, 08 Masuda, Atsushi, 0C Mendes Leitão, K. Bittencourt, 0I Merzlic, Sebastien, 03, 0L Meyer, Corey W., 05 O'Brien, Gregory, 03, 0L Ogawa, Kinichi, 0C Oh, Jaewon, 0D Patel, Tirth, 0B Phillips, Nancy, 02 Pickel, Tobias, 0B, 0H Potter, Barrett G., 0G, 0J, 0K Prasad, Basudev, 0D Ramirez, C., 0K Rezende, André L. T., 0I Sakurai, Keiichiro, 0C Sastry, Oruganty S., 0D Schmitz, Darshan, 0C Shibata, Hajime, 0C Simmons-Potter, Kelly, 06, 0G, 0J, 0K Steijvers, H., 09 Sweet, Noah W., 05 Tamizhmani, Govindasamy, 08, 0D Tatapudi, Sai, 08, 0D Theelen, M., 09 Tokuda, Shuuji, 0C Tomita, Hiroshi, 0C Trout, T. John, 02 Wan, Kai-tak, 03, 0L Wang, Yu, 03, 0L Winkler, Thilo, 0H Wirsching, Sven, 0H Yu, Bao-Ling, 02 Zetzmann, Cornelia, 0B Conference CommitteeProgram Track Chair Conference Chairs
Conference Program Committee
Session Chairs
IntroductionThe SPIE Reliability of Photovoltaic Cells, Modules, Components, and Systems X Conference as part of the Optics and Photonics for Sustainable Energy symposium took place at San Diego, CA on Sunday through Monday, 6–7 August 2017. Sunday, August 6 The afternoon Session 1 on Backsheets, was chaired by Dr. Helio Moutinho, National Renewable Energy Laboratory (NREL) and myself, Neelkanth G. Dhere. It had presentations of two invited papers entitled i) “Comparison of higher irradiance and black panel temperature UV baksheet exposure to field performance” by Felder et al and ii) “Characterizing the weather induced in the changes in the optical performance poly(ethylene-terephthalate) via MaPd:RTS spectroscopy by Gordon et al and two contributed papers. The next two afternoon sessions, 2 and 3, on Field to Chamber Comparison and Thin Film Durability were chaired by Dr. Michael D. Kempe, National Renewable Energy Lab (NREL) had three contributed presentations including a very good paper on Artefact-free coring of solar modules by Dr. Helio Moutinho et al, National Renewable Energy Laboratory (NREL). The last afternoon Session 3 had presentation of an invited paper entitled, “Exposure of CIGS cells to negative, zero and positive electrical biases in dampheat illuminated environment” by Nicolas Barreau et al. There was also one contributed paper. Monday, August 7 The morning Session 4 General PV Module PV Module Construction of PV Arrays Reliability Accelerated and Outdoor Testing I was chaired by myself. It had one invited paper entitled, “Impact of PID on industrial roof-top PV installations” by Claudia Buerhop Lutz et al and two contributed papers. After the morning Coffee break, Session 5 on General PV Module Reliability Accelerated and Outdoor Testing II was chaired by Dr. Keiichiro Sakurai of National Institute of Advanced Industrial Science and Technology (Japan). It had two contributed papers prior to the morning coffee break and four contributed papers after. The Posters Session took place on Monday, August 29 during 5:30 PM - 7:30 PM. It had two posters related to PV Module Reliability. Overall the SPIE Reliability of Photovoltaic Cells, Modules, Components, and Systems X Conference has a good following and was very well-attended with participants from USA, Europe, India, Japan and Republic of Korea. It had 20 papers presented. The discussion and question-answer sessions were very lively and interesting. Next year the Conference Chairmanship will be passed on to Dr. Michael Kempe who has kindly agreed to accept this appointment. We would like to thank the authors and other participants for their continuing interest and valuable support. We would also like all of you to continue to provide your support to the incoming Conference Chair, Dr. Michael D. Kempe. Neelkanth G. Dhere Keiichiro Sakurai Michael D. Kempe |
