Effect of light irradiation and forward bias during PID tests of CIGS PV modules

Keiichiro Sakurai; Hiroshi Tomita; Kinichi Ogawa; Darshan Schmitz; Hajime Shibata; Shuuji Tokuda; Atsushi Masuda

doi:10.1117/12.2275348

23 August 2017 Effect of light irradiation and forward bias during PID tests of CIGS PV modules

Keiichiro Sakurai, Hiroshi Tomita, Kinichi Ogawa, Darshan Schmitz, Hajime Shibata, Shuuji Tokuda, Atsushi Masuda

Proceedings Volume 10370, Reliability of Photovoltaic Cells, Modules, Components, and Systems X; 103700C (2017) https://doi.org/10.1117/12.2275348
Event: SPIE Optical Engineering + Applications, 2017, San Diego, California, United States

Abstract

We have conducted potential induced degradation (PID) tests on CIGS photovoltaic (PV) modules with/without LED white light irradiation. Suppression of PID degradation was observed by light irradiation.

Citation Download Citation

Keiichiro Sakurai, Hiroshi Tomita, Kinichi Ogawa, Darshan Schmitz, Hajime Shibata, Shuuji Tokuda, and Atsushi Masuda "Effect of light irradiation and forward bias during PID tests of CIGS PV modules", Proc. SPIE 10370, Reliability of Photovoltaic Cells, Modules, Components, and Systems X, 103700C (23 August 2017); https://doi.org/10.1117/12.2275348

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