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15 March 2018 Reflection gradient light interference microscopy (epi-GLIM) for label-free imaging of bulk specimens (Conference Presentation)
Mikhail E. Kandel, Catherine Best-Popescu, Gabriel Popescu
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Proceedings Volume 10503, Quantitative Phase Imaging IV; 105030F (2018) https://doi.org/10.1117/12.2294032
Event: SPIE BiOS, 2018, San Francisco, California, United States
Abstract
Gradient Light Interference Microscopy (GLIM) is a phase-shifting technique that upgrades a conventional differential interference contrast (DIC) microscope to produce quantitative phase images. Benefiting from equally matched beams, fully open microscope condenser, as well as coherence gating due to the removal of non-interferometric terms upon phase-retrieval, GLIM has the potential to enable studies of mesoscopic structure hundreds of microns thick. Nevertheless, many such biological samples are much too big to completely transmit light, requiring the use of reflection microscopy. Here we present our early work on constructing a new reflection mode GLIM microscope designed to image thick biological structures, as well as a detailed comparison between transmitted vs reflected light modalities for a number of calibration samples.
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© (2018) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
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Mikhail E. Kandel, Catherine Best-Popescu, and Gabriel Popescu "Reflection gradient light interference microscopy (epi-GLIM) for label-free imaging of bulk specimens (Conference Presentation)", Proc. SPIE 10503, Quantitative Phase Imaging IV, 105030F (15 March 2018); https://doi.org/10.1117/12.2294032
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KEYWORDS
Microscopy
Microscopes
Light scattering
Backscatter
Calibration
Digital image correlation
Interferometry
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