Open Access Paper
21 November 2017 Development of a 750x750 pixels CMOS imager sensor for tracking applications
Franck Larnaudie, Nicolas Guardiola, Olivier Saint-Pé, Bruno Vignon, Michel Tulet, Robert Davancens, Pierre Magnan, Franck Corbière, Philippe Martin-Gonthier, Magali Estribeau
Author Affiliations +
Proceedings Volume 10568, International Conference on Space Optics — ICSO 2004; 105681R (2017) https://doi.org/10.1117/12.2307994
Event: International Conference on Space Optics 2004, 2004, Toulouse, France
Abstract
Solid-state optical sensors are now commonly used in space applications (navigation cameras, astronomy imagers, tracking sensors...). Although the charge-coupled devices are still widely used, the CMOS image sensor (CIS), which performances are continuously improving, is a strong challenger for Guidance, Navigation and Control (GNC) systems. This paper describes a 750x750 pixels CMOS image sensor that has been specially designed and developed for star tracker and tracking sensor applications. Such detector, that is featuring smart architecture enabling very simple and powerful operations, is built using the AMIS 0.5μm CMOS technology. It contains 750x750 rectangular pixels with 20μm pitch. The geometry of the pixel sensitive zone is optimized for applications based on centroiding measurements. The main feature of this device is the on-chip control and timing function that makes the device operation easier by drastically reducing the number of clocks to be applied. This powerful function allows the user to operate the sensor with high flexibility: measurement of dark level from masked lines, direct access to the windows of interest… A temperature probe is also integrated within the CMOS chip allowing a very precise measurement through the video stream. A complete electro-optical characterization of the sensor has been performed. The major parameters have been evaluated: dark current and its uniformity, read-out noise, conversion gain, Fixed Pattern Noise, Photo Response Non Uniformity, quantum efficiency, Modulation Transfer Function, intra-pixel scanning. The characterization tests are detailed in the paper. Co60 and protons irradiation tests have been also carried out on the image sensor and the results are presented. The specific features of the 750x750 image sensor such as low power CMOS design (3.3V, power consumption<100mW), natural windowing (that allows efficient and robust tracking algorithms), simple proximity electronics (because of the on-chip control and timing function) enabling a high flexibility architecture, make this imager a good candidate for high performance tracking applications.
© (2017) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Franck Larnaudie, Nicolas Guardiola, Olivier Saint-Pé, Bruno Vignon, Michel Tulet, Robert Davancens, Pierre Magnan, Franck Corbière, Philippe Martin-Gonthier, and Magali Estribeau "Development of a 750x750 pixels CMOS imager sensor for tracking applications", Proc. SPIE 10568, International Conference on Space Optics — ICSO 2004, 105681R (21 November 2017); https://doi.org/10.1117/12.2307994
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KEYWORDS
CMOS sensors

Sensors

Control systems

Ionizing radiation

Electro optics

Image sensors

Imaging systems

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